Method for testing pins of integrated circuit

Abstract

The invention discloses a method for testing pins of an integrated circuit. The method relates to a test module, an I / O (digital-to-analogue conversion) interface module and an I / O control module. The test module is prearranged inside a chip to be tested and matched with the I / O interface module and the I / O control module, the test module conducts testing in an IOMODE1 test mode and in an IOMODE2 test mode, the I / O interface module receives test instructions and controls the test module to be converted between the IOMODE1 test mode and the IOMODE2 test mode, and the I / O control module is used for controlling the I / O direction of the chip to be tested and transmitting the level of the input pins of the chip to be tested to the corresponding output pins. When the test module is used for testing, the whole test can be finished only by conducting two times of testing in the two test modes, and therefore test time is greatly shortened and test cost is greatly lowered.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to an integrated circuit testing method capable of replacing traditional O / S testing (opening and short circuit testing). Background technique [0002] The traditional O / S test is to verify whether the tested pin is short-circuited with other pins. In the integrated circuit design, in order to protect the IC, each pin is provided with a protection diode between the pin and the ground and the power supply. The O / S test is to test the characteristics of these two diodes. The test principle is: test two diodes separately, when testing the diode between the pin and the power supply, it is to test the voltage drop of the diode of the power supply, add a current of 100uA to the measured pin, and give zero potential to the other pins , or directly grounded. After the diode is turned on, test the level of the pin. If the level is between 0.2V-1.5V, the pin is not short-circuited,...

AI Technical Summary

Problems solved by technology

Assuming that there is a 176-pin IC, if a PMU (Precise Measurement Unit) structure testing machine is used, it needs to measure 176*2=352 times, so the test cost is high and the efficiency is relatively low. , each pin has a precision measurement unit) structure testing machine for testing, although parallel testing can be performed, but due to the high purchase cost of the PPMU structure testing machine, the test cost is very high, and the PPMU structure can only test each Whether a pin is open circuit, can not test whether there is a short circuit between adjacent pins

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