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Measuring Equipment And Measuring Method

A technology of measuring device and measuring method, applied in the direction of using electric radiation detector for photometry etc.

Active Publication Date: 2014-06-25
IND TECH RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method is also limited by the height of the traditional probe, making the light acceptance angle of 128 degrees

Method used

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  • Measuring Equipment And Measuring Method
  • Measuring Equipment And Measuring Method
  • Measuring Equipment And Measuring Method

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Embodiment Construction

[0029] Devices and methods of use of various embodiments of the present invention are discussed in detail below. It should be noted, however, that the present invention provides many possible inventive concepts that can be implemented in various specific scopes. These specific examples are only used to illustrate the device and method of use of the present invention, but are not intended to limit the scope of the present invention.

[0030] figure 1 It is a schematic diagram of an embodiment of the measuring device proposed by the present invention. As shown in the figure, the measuring device 100 includes a conductive probe card 101 , an optical receiving module 102 , a light splitting module 103 and a data processing module 104 . The measurement device 100 can be applied to the detection of optical characteristics. For example, the measurement device 100 can detect various optical parameters such as spectrum, wavelength, total luminous flux, brightness and chromaticity of...

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Abstract

The present invention provides a measuring equipment and a measuring method. The measuring equipment includes a conductive probe card, an optical receiving module, a light splitting module and a data processing module. The conductive probe card is located on at least one light-emitting device of the chip to drive at least the one light-emitting device to make the at least the one light-emitting device emit an incident light through the conductive probe card; the optical receiving module is used for receiving the incident light through the conductive probe card; the light splitting module converts the incident light to a spectral signal; moreover, the data processing module calculates an optical parameter based on the spectral signal.

Description

technical field [0001] The invention relates to a method for measuring optical properties, in particular to a method for measuring the total luminous flux of a light-emitting diode (LED) through a conductive probe card. Background technique [0002] LED (Light emitting diode) has the characteristics of low power consumption, long life, and fast response, and is known as the next generation of lighting components. LED industry structure is divided into upper, middle and lower reaches. After the raw materials are made into epitaxial chips in the upstream, the midstream is responsible for integrating them into LED chips, cutting the dies into single dies (LED chip die), and finally packaging the dies into various types of LEDs in the downstream. Therefore, measuring the optical parameters of LEDs is very important for evaluating the energy conversion efficiency of light sources. [0003] At present, for LEDs, methods for measuring optical parameters (such as total luminous fl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42
Inventor 卓嘉弘庄凯评刘志祥谢易辰周森益蔡伟雄
Owner IND TECH RES INST