Infrared band alignment monitoring device
A monitoring device and infrared band technology, applied in weapon accessories, optics, instruments, etc., can solve the problems of low reliability, high cost, and large volume, and achieve the effect of compact structure, high cost performance, and high damage threshold
Inactive Publication Date: 2015-06-10
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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[0004] In order to solve the existing problems of large size, high cost and low reliability in the alignment monitoring of multi-band infrared lasers by using two kinds of infrared imaging systems, the present invention provides a high reliability, compact structure, small volume and low cost Infrared Band Alignment Monitoring Device
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[0025] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0026] An infrared band alignment monitoring device of the present invention mainly consists of a base plate 1, a side base plate cover 2, an infrared four-quadrant detector 3, an upper base plate cover 4, a power supply 5, a signal converter 6, an infrared optical system 7, and an energy attenuation system 8. Flange 9, two-dimensional fine-tuning mirror 10, time-sharing attenuator 11, total reflection mirror 12, and beam combining mirror 13. Such as figure 1 As shown, the side floor cover 2 is installed on the edge of the bottom plate 1, and the upper floor cover 4 is installed on the side floor cover 2. The bottom plate 1, the side floor cover 2 and the upper floor cover 4 form an empty box structure. The infrared four-quadrant detector 3, the power supply 5. The signal converter 6, the infrared optical system 7, the energy attenuation system 8, the flange...
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The invention discloses an infrared band alignment monitoring device, and relates to the field of beam control. The infrared band alignment monitoring device solves the problems that the size is large, cost is high and reliability is low when existing two infrared imaging systems are adopted to carry out alignment monitoring on a multiband infrared laser. According to the infrared band alignment monitoring device, medium and long wave infrared lasers enter a time-share attenuator after the effects of a beam combiner, through the effects of time-share monitoring and first energy attenuation of the time-share attenuator, the medium and long wave infrared lasers are reflected by a full reflection mirror and enter an energy attenuation system, through the effects of secondary energy attenuation of the energy attenuation system, through the effects of the color aberration elimination and image aberration elimination of an infrared optical system, the medium and long wave infrared lasers are imaged on a central target surface of an infrared four-quadrant detector, and the infrared four-quadrant detector receives light spot position information for monitoring. The infrared band alignment monitoring device is high in reliability, compact in structure, small in size and low in cost, the infrared laser wave bands ranging from 3 microns to 5 microns and ranging from 8 microns to 12 microns can be monitored at the same time, the power ranges from 1 W to 10 kW, and the angular resolution is 5'.
Description
field of invention [0001] The invention relates to the technical field of light beam control, in particular to an infrared band alignment monitoring device. Background technique [0002] With the rapid development of laser technology, laser products based on various laser sources are widely used in military, industrial and medical fields, among which beam control technology is becoming more and more important. In the field of beam control technology, people are generally concerned about the pointing position of the laser beam, and a variety of real-time monitoring equipment and devices have been developed. However, in the field of infrared bands, due to the invisible characteristics of the beam, there is no method to use the same device. , while monitoring the position information of laser beams in multiple infrared bands. [0003] For the alignment monitoring of laser beams in the infrared band, two types of infrared imaging systems were usually used in the past, correspon...
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IPC IPC(8): F41A33/00G02B27/30
Inventor 郭汝海
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI