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Response time test method and device

A technology of response time and test method, applied in the computer field, can solve the problems of long test cycle, affecting the application development process, legacy, etc., to achieve the effect of convenient and quick acquisition

Inactive Publication Date: 2014-10-29
TENCENT TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the long test cycle of the response time of the application caused by adding relevant codes to the source code of the application to obtain the response time, which will affect the development process of the application, and it is easy to leave the test response in the source code For the problem of time-related codes, the embodiment of the present invention provides a response time testing method and device

Method used

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Experimental program
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Embodiment 1

[0027] Please refer to figure 1 , which shows a method flowchart of a response time testing method provided in Embodiment 1 of the present invention. The test methods for the response time include:

[0028] Step 101, when the application program is running, collect at least two pictures for recording screen changes;

[0029] When the application program is running on the terminal, at least two pictures for recording the screen changes of the terminal are collected.

[0030] Step 102, record the acquisition time of at least two pictures;

[0031] While collecting at least two pictures for recording screen changes, recording respective collection moments of the at least two pictures.

[0032] Step 103, identifying the first picture corresponding to the start of operation from at least two pictures;

[0033] The first picture corresponding to the start of operation is identified from the at least two pictures collected for recording screen changes.

[0034] Step 104, identif...

Embodiment 2

[0040] Please refer to figure 2 , which shows a method flowchart of a response time testing method provided in Embodiment 2 of the present invention. The test methods for the response time include:

[0041] Step 201, obtaining a set of template pictures;

[0042] Obtain a set of template pictures, where the template pictures are a set of pictures collected at predetermined time intervals when the application is running and used to record screen changes. For example, when testing the response time of an application on a mobile phone, collect a set of pictures that record changes in the screen of the mobile phone from the beginning of the application to the end of the operation, and can follow the Take screenshots of the mobile phone screen at predetermined time intervals until the program finishes running. Obtain a set of pictures that record screen changes during the running of the application, including at least two pictures; suppose that during the running of the applica...

Embodiment 3

[0071] Please refer to image 3 , which shows a schematic diagram of a device structure of a response time test device provided in Embodiment 3 of the present invention. The response time testing device includes: an acquisition module 301 , a recording module 302 , a first identification module 303 , a second identification module 304 and a calculation module 305 .

[0072] The collection module 301 is configured to collect at least two pictures for recording screen changes when the application program is running.

[0073] The recording module 302 is configured to record the respective collection times of at least two pictures collected by the collection module 301 .

[0074] The first identification module 303 is configured to identify the first picture corresponding to the start of operation from at least two pictures collected by the collection module 301 .

[0075] The second identification module 304 is configured to identify a second picture corresponding to the end of...

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Abstract

The invention discloses a response time test method and device and belongs to the technical field of computers. The method includes the steps that when an application program runs, at least two pictures used for recording changes of a screen are acquired; the times when the at least two pictures are acquired are recorded; the first picture corresponding to operation start is recognized; the second picture corresponding to operation end is recognized; the difference between the acquisition time of the first picture and the acquisition time of the second picture is calculated and used as the response time of the application program. According to the response time test method and device, by acquiring and recognizing the two pictures corresponding to operation start and operation end of the application program in the running process, calculating the difference between the acquisition times of the two pictures and using the difference as the response time of the application program, the problems that in the prior art, the response time test period is long, and relevant codes for testing the response speed are prone to being left in source codes are solved, and the response time of the application program can be obtained conveniently and fast.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a response time testing method and device. Background technique [0002] In the application program development process, in order to analyze and judge the performance and availability of the application program, it is necessary to test the response time of the application program. The response time of an application is the time from when the application starts running to when it finishes running. [0003] An existing test method is: add relevant codes in the source code of the application to complete the test of the response time. Specifically, the relevant codes record the start time of the application when the application starts to run, and record the start time of the application when the application ends. Record the end time of the operation, calculate the difference between the end time and the start time, and use the difference as the response time of the application. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 傅学君徐铮
Owner TENCENT TECH (SHENZHEN) CO LTD
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