Large-current synthesis transient state circuit for electronic current transformer

A current transformer and transient waveform technology, applied in the field of transient waveform synthesis circuit, can solve the problems of current transformer error, increase of primary excitation current, increase of iron loss, etc., and achieve the effect of precise adjustment

Active Publication Date: 2014-12-03
STATE GRID CORP OF CHINA +2
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the equal ampere-turn method is used for the equivalent error test, although the multi-turn primary wire is evenly distributed on the winding circumference, the magnetic field generated by it is uniform in segments as a whole, but the magnetic field near the coil plane of each turn is the strongest, causing its corresponding The local magnetic density of the iron core increases, and even local magnetic saturation occurs, the iron loss increases, and the primary excitation current increases, which eventually causes the error of the current transformer to deviate accordingly.

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  • Large-current synthesis transient state circuit for electronic current transformer
  • Large-current synthesis transient state circuit for electronic current transformer
  • Large-current synthesis transient state circuit for electronic current transformer

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Embodiment Construction

[0031] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0032] The principle of the transient waveform generation circuit suitable for the large current synthesis test of electronic current transformer provided in this embodiment is as follows: figure 1 As shown, the circuit includes a controller unit, a DC charging power supply and a waveform output unit;

[0033] 1. As shown in the figure, the waveform output unit is connected between the DC charging power supply and the ECT test product, including: charging thyristors D1 and D2, discharging thyristors D3 and D4, freewheeling diode ...

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Abstract

The invention provides a large-current synthesis transient state circuit for an electronic current transformer. The large-current synthesis transient state circuit comprises a controller unit, a direct-current charging power supply and a waveform output unit, the waveform output unit is connected with an ECT test product, the controller unit comprises a charging control module, a discharging control module, a waveform monitoring module and a transient state waveform adjustment module, the controller unit is used for controlling the work state of an electronic component in the waveform output unit, and accordingly the waveform output unit is controlled to output transient state voltage waveforms and transient state current waveforms to the ECT test product. Compared with the prior art, the large-current synthesis transient state circuit for the electronic current transformer can accurately adjust current peak values and attenuation time constants of the output transient state voltage waveforms and the output transient state current waveforms, so that detection requirements of electronic current transformer test products of different models are met.

Description

technical field [0001] The invention relates to a transient waveform synthesis circuit, in particular to a transient waveform circuit for large current synthesis of an electronic current transformer. Background technique [0002] The transient test of electronic current transformer includes direct method and equal ampere-turn method. The direct method is tested by a large-capacity current source with phase-selection closing function, and the test process needs to meet the time constant requirements of the primary circuit. Yet still do not possess at present the long-time current transformer high-current transient test facility; As when the rated current is 2kA, the symmetrical short-circuit current can not carry out the transient test to it when the symmetrical short-circuit current is 40kA, a large number of long-term observations, research findings by the inventor At present, there is no existing technology that can meet the requirements of the transient error test of the...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 汪本进徐思恩王晓琪吴士普邱进余春雨毛安澜冯宇杜砚李璿王玲陈晓明陈江波李辉许晶何妍周翠娟朱丝丝金逸袁宇波卜强生
Owner STATE GRID CORP OF CHINA
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