Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Self-adaptation polarline correcting method based on infrared binocular camera

An epipolar line correction and binocular camera technology, applied in the field of computer vision, can solve problems such as the difficulty of infrared binocular camera calibration, and achieve fast speed, high robustness, and strong adaptability

Active Publication Date: 2014-12-24
NANJING UNIV OF SCI & TECH
View PDF2 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem of difficult calibration of infrared binocular cameras, the present invention proposes a method for correcting polar lines of infrared binocular cameras suitable for calibration without cameras. During the calibration process, only two infrared binocular images are required as input, and no The operator participates in the intermediate process, with strong adaptability and high precision

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-adaptation polarline correcting method based on infrared binocular camera
  • Self-adaptation polarline correcting method based on infrared binocular camera
  • Self-adaptation polarline correcting method based on infrared binocular camera

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] Due to the low resolution and high noise of the infrared image, it is more prone to mis-matching compared with the visible light image. The invention uses the improved outlier detection idea of ​​the proximity degree to remove the mis-matching points and avoids the iterative process in the existing method. At the same time, the number of unknown parameters of Gluckman's epipolar correction model is small, the calculation process is simple, and the purpose of global optimization can be achieved by using the improved particle swarm optimization algorithm.

[0020] The inventive method comprises the following steps:

[0021] Step 1: According to Gluckman's epipolar correction model, solve the projection transformation matrix H 1 、H 2 The specific form; in Gluckman's epipolar correction model, the epipolar correction process of binocular images can be divided into 4 steps, each step is actually a decomposition of the projection transformation matrix, so the projection tran...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a self-adaptation polarline correcting method based on an infrared binocular camera. Only two infrared images are needed to serve as the input, and an infrared binocular image is preprocessed to achieve the contrast enhancement; SIFT feature points are extracted from the two infrared images respectively, and matching points are obtained through matching; when the error matching is processed, and the error matching point is eliminated according to the improved outlier detection idea based on the neighbor degree; the global optimization is carried out through the improved particle swarm optimization introducing the chaos optimization idea and the hybrid idea in the genetic algorithm, and two transformation matrixes are obtained; pixel mapping is carried out on the two infrared images according to the corresponding transformation matrixes, and then the corrected binocular image can be obtained. The experiment shows that the method can be suitable for most scenes and has very high correction precision and self-adaptability.

Description

technical field [0001] The invention belongs to the field of computer vision, and in particular relates to an infrared binocular camera adaptive epipolar line correction method. Background technique [0002] Binocular stereo vision technology is widely used in the field of robot vehicle navigation and target detection. With the maturity of infrared imaging technology, the quality of infrared images obtained is getting higher and higher, and the stereoscopic vision technology of infrared band is getting more and more attention. In the ideal state of satisfying the epipolar constraints, the epipolar lines of the binocular image planes are parallel to each other, so during stereo matching, the search only needs to be along the horizontal direction, which greatly improves the matching efficiency. However, in practical applications, the optical axis of the binocular camera is usually in a non-parallel mode, and the error may even be large, and the obtained binocular image does n...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00
Inventor 张毅柏连发吴磊韩静岳江王博左金轮赵北祁伟
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com