SVM (support vector machine) classifier training sample acquiring method, training method and training system

A technology of training samples and acquisition methods, which is applied in the direction of instruments, character and pattern recognition, computer components, etc., can solve the problems of large sample space complexity and susceptibility to the influence of noise samples, and achieve reduced recognition time, simple training, and The effect of reducing the error rate

Inactive Publication Date: 2014-12-31
GUANGZHOU HUADUO NETWORK TECH
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AI Technical Summary

Problems solved by technology

[0009] In view of the complexity of the sample space of the classifier in the above-mentioned background technology and the problem that it is easily affected by noise samples, the purpose of the present invention is to provide a method and system for obtaining training samples for SVM classifiers, which can reduce the number of classifiers. The complexity of the sample space, and reduce the impact of noisy samples on classifier training

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  • SVM (support vector machine) classifier training sample acquiring method, training method and training system
  • SVM (support vector machine) classifier training sample acquiring method, training method and training system
  • SVM (support vector machine) classifier training sample acquiring method, training method and training system

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Embodiment Construction

[0036] see figure 1 , figure 1 It is a schematic flowchart of the first embodiment of the method for obtaining SVM classifier training samples in the present invention.

[0037] Described SVM classifier training sample obtaining method, comprises the following steps:

[0038] S101, calculate and obtain the distance between each sample of the SVM classifier;

[0039] S102. Comparing the distance of each of the samples with a first distance threshold, clustering the samples for the first time, acquiring at least one first category, and samples included in each of the first categories;

[0040] S103. Comparing the distance of each of the samples with a second distance threshold, performing a second clustering on the samples, acquiring at least one second category, and samples included in each of the second categories; wherein, the first a second distance threshold is greater than the first distance threshold;

[0041] S104. When one of the second classifications contains only...

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Abstract

The invention provides an SVM (support vector machine) classifier training sample acquiring method, a training method and a training system. The SVM classifier training sample acquiring method includes calculating to acquire distance of each sample of an SVM classifier; according to the distance of each sample, clustering the samples for the first time to acquire at least one first category and the samples contained by each first category; clustering the samples for the second time to acquire at least one second category and the samples contained by each second category, wherein a second distance threshold value is larger than a first distance threshold value; dividing the samples in the second categories containing one sample only into isolated samples; selecting one sample in each first category as a representative sample, and setting the training samples of the SVM classifier according to the representative samples and the isolated samples. By the SVM classifier training sample acquiring method, the training method and the training system, number of the samples can be reduced effectively, complexity of sample space of the classifier is lowered, and classifier training is enabled to be simpler and more effectively.

Description

technical field [0001] The present invention relates to the technical field of SVM classifiers, in particular to a method for obtaining training samples of an SVM classifier and a system thereof, as well as a method for training an SVM classifier and a system thereof. Background technique [0002] SVM (Support Vector Machine) was first proposed by Cortes and Vapnik in 1995. It shows many unique advantages in solving small samples, nonlinear and high-dimensional pattern recognition, and can be extended to other machine learning such as function fitting. problem. [0003] SVM is based on the VC dimension (vapnik-chervonenkis dimension) theory of statistical learning theory and the principle of structural risk minimization, according to the complexity of the model (that is, the learning accuracy of specific training samples) and learning ability ( That is, the ability to identify any sample without error) to seek the best compromise in order to obtain the best generalization a...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/66
Inventor 苗广艺路香菊单霆
Owner GUANGZHOU HUADUO NETWORK TECH
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