Optical microscope geostress measurement device based on aperture deformation principle
A technology of optical microscopy and measuring devices, which is applied in the direction of measuring devices, using optical devices, measuring the change force of optical properties of materials when they are stressed, and can solve the problem that the stress relief method is complicated in the test process and difficult to realize. Mi test depth breakthrough, hinder application and other problems, achieve significant scientific significance and economic and practical value, improve reliability and application range, and reduce the requirements of test environment
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[0045] Below in conjunction with accompanying drawing and implementation example the present invention is further described:
[0046] Such as Figure 1~4 As shown, an optical microscopic stress measurement device based on the principle of aperture deformation includes a multi-stylus measurement component 1 and an optical microscopic imaging component 2 . The multi-stylus measuring component 1 and the optical microscopic imaging component 2 are connected into one body through a threaded button 3 .
[0047] The multi-probe measurement component 1 includes a stylus 11 , a spring 12 , a limit card 13 , a balance weight 15 , a housing 16 and a bottom cover 17 . The contact pins 11 are in pairs, and the number is not less than three pairs; the contact pins 11 are symmetrically arranged and located on the same cross-section in the housing 16;
[0048] The stylus 11 includes a contact 111, a stylus 113, a stylus spring rod 114 and a stylus tip 112 connected in sequence, the stylus 1...
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