Method for testing power consumption of memory
A technology for testing memory and memory. It is applied in the direction of detecting faulty computer hardware. It can solve the problems of large memory power consumption data errors, inaccurate memory power consumption calculations, and power consumption errors. It achieves high sensitivity and good prospects for promotion and use. , easy-to-operate effect
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Embodiment 1
[0010] The method for testing memory power consumption described in this embodiment proposes a memory power consumption test device. The memory power consumption test device includes a memory, a memory riser card and a resistor, and the memory riser card is arranged in the memory of the motherboard. In the slot (DIMM slot), the memory card is fixedly connected to the memory riser card, the memory is independently connected from the memory slot of the motherboard through the memory riser card, the memory is connected in series with the resistor, and the resistor is connected through the resistor. The current through the entire memory is the current value of the entire memory. The current passing through the memory stick is measured through the resistor, and then multiplied by the VDD voltage of the memory to accurately calculate the power consumption of the memory.
[0011] It can be seen from the technical solution of the above-mentioned method for testing memory power consumpt...
Embodiment 2
[0013] The method for testing memory power consumption described in this embodiment is based on the method for testing memory power consumption described in Embodiment 1, and tests the memory power consumption in different states. The method for testing memory power consumption described in this embodiment is to combine the memory pressure program under the system to calculate the value of memory power consumption in different states.
[0014] In the method for testing the power consumption of the memory described in this embodiment, the memtester software is used to test the current values of different passing resistors under different pressure states, and then the test current value is multiplied by the VDD voltage value of the memory to obtain different pressures. The actual memory power consumption value in the state; or directly run the customer's application, you can actually calculate the memory power consumption of the customer's application.
[0015] Through the met...
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