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Method for testing power consumption of memory

A technology for testing memory and memory. It is applied in the direction of detecting faulty computer hardware. It can solve the problems of large memory power consumption data errors, inaccurate memory power consumption calculations, and power consumption errors. It achieves high sensitivity and good prospects for promotion and use. , easy-to-operate effect

Inactive Publication Date: 2015-01-28
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the method of testing memory power consumption is mainly to calculate the power consumption of the memory by multiplying the current of the server motherboard and the voltage of the memory VDD (power supply terminal). There will be some errors in power consumption, because part of the test is for The processor on the main board of the server is powered by other devices such as the processor, so the power consumption of the processor is also included in the test power consumption value of the memory, which will cause inaccurate calculation of memory power consumption and cause large errors in memory power consumption data.

Method used

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Examples

Experimental program
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Embodiment 1

[0010] The method for testing memory power consumption described in this embodiment proposes a memory power consumption test device. The memory power consumption test device includes a memory, a memory riser card and a resistor, and the memory riser card is arranged in the memory of the motherboard. In the slot (DIMM slot), the memory card is fixedly connected to the memory riser card, the memory is independently connected from the memory slot of the motherboard through the memory riser card, the memory is connected in series with the resistor, and the resistor is connected through the resistor. The current through the entire memory is the current value of the entire memory. The current passing through the memory stick is measured through the resistor, and then multiplied by the VDD voltage of the memory to accurately calculate the power consumption of the memory.

[0011] It can be seen from the technical solution of the above-mentioned method for testing memory power consumpt...

Embodiment 2

[0013] The method for testing memory power consumption described in this embodiment is based on the method for testing memory power consumption described in Embodiment 1, and tests the memory power consumption in different states. The method for testing memory power consumption described in this embodiment is to combine the memory pressure program under the system to calculate the value of memory power consumption in different states.

[0014] In the method for testing the power consumption of the memory described in this embodiment, the memtester software is used to test the current values ​​of different passing resistors under different pressure states, and then the test current value is multiplied by the VDD voltage value of the memory to obtain different pressures. The actual memory power consumption value in the state; or directly run the customer's application, you can actually calculate the memory power consumption of the customer's application.

[0015] Through the met...

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PUM

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Abstract

The invention discloses a method for testing the power consumption of a memory. The method comprises the following steps of connecting a resistor to the memory in series by using a memory increasing card; measuring current passing through a memory bank by the resistor; then multiplying the current by VDD (Voltage Drain Drain) of the memory to accurately calculate the power consumption of the memory; meanwhile, calculating values of the power consumption in different states by combining a memory pressure procedure under the system. Compared with the traditional method for testing the power consumption of the memory, the method for testing the power consumption of the memory, has the advantages that the accuracy is higher; the power consumption values of the memory in different states can be tested; the power consumption conditions of the memories from all manufacturers can be transversely compared, so the convenience is brought to the selection of customers; the simplicity and feasibility for operation are realized; higher practicality and better popularization and use prospect are obtained.

Description

technical field [0001] The invention relates to memory testing technology, in particular to a method for testing memory power consumption. Background technique [0002] At present, the main method of testing memory power consumption is to calculate the power consumption of the memory by multiplying the current of the server motherboard and the voltage of the memory VDD (power terminal), there will be some errors in power consumption, because part of the test is to give The processor on the motherboard of the server is powered by other devices, so that the power consumption of the processor is also included in the test power consumption value of the memory, which will cause inaccurate calculation of the memory power consumption, resulting in a large error in the memory power consumption data. SUMMARY OF THE INVENTION [0003] Aiming at the shortcomings of the prior art, the present invention provides a relatively simple, easy-to-operate, and high-sensitivity memory power co...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 刘胜
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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