High-temperature high-pressure vacuumizing test device and operating method thereof

Abstract

The invention discloses a high-temperature high-pressure vacuumizing test device and an operating method thereof. The high-temperature high-pressure vacuumizing test device comprises a vessel holder (3), a console (4), a stander (1) for installing the vessel holder (3) and the console (4) and an interface (2), wherein a test vessel (6) which is used for arranging a test sample (5) and provided with a sealing cover is arranged in the vessel holder (3), and the high-temperature high-pressure vacuumizing test device also comprises a pressure system, a temperature system and a vacuum pump (8); the pressure system is arranged in the console (4), and the pressure system is communicated with the test vessel (6) to adjust the pressure value in the test vessel (6); the temperature system consists of a part which is arranged in the console (4) and a part which is arranged in an inner cavity of the test vessel (6), and the two parts of the temperature system are communicated with each other to adjust the temperature value in the test vessel (6); the vacuum pump (9) is arranged on the stander. The high-temperature high-pressure vacuumizing test device integrates the temperature system, the pressure system and the vacuumizing system.

Description

technical field [0001] The invention relates to the technical field of a high-temperature and high-pressure vacuum pumping test device and its operating method, in particular to a high-temperature and high-pressure vacuum pumping test device and its operating method for scientific research institutions, universities, and high-tech companies to test product test data. Background technique [0002] Test and test products, especially components used in military industry and aerospace, in order to test their reliability, it is necessary to carry out simulation tests under high temperature, high pressure and vacuum harsh environment, and analyze the data of the test samples after the test, such as: test samples The working voltage, working current, strength, hardness, etc., provide a reliable basis for the practical application of test samples. Usually, the test device adjusts the pressure value in the container through the pressure system, so that the test sample is tested in th...

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Problems solved by technology

Usually, the test device adjusts the pressure value in the container through the pressure system, so that the test sample is tested in the container with the specified pressure value, so as to test the test data of the test sample under high pressure, but the device cannot complete the adjustment of the temperature in the container, so It is also impossible to make the test sample complete the high temperature and high pressure test in the same container, so that the test sample can only complete one test in a single environment, such as: the test sample can only complete the high pressure test or high temperature test in the same time period, and cannot be carried out at the same time High temperature and high pressure test

That is to say, in the prior art, a test is carried out in one environment, and the next test is carried out in another environment, and the environment changes, so that the data obtained by the test is deviated, that is, the test sample cannot be fully analyzed The test data under complex working conditions will affect the convincingness of the test data; before increasing the pressure in the container, the aforementioned pressure test device cannot eliminate the impurity gas in the container, so that the impurity gas will participate in the subsequent test process, thereby affecting the The accuracy of the test data, such as: the test sample is under high temperature and high pressure, and the container is doped with oxygen, which can easily cause the test sample to be oxidized in the container, which seriously affects the test effect

[0003] At present, people also try to combine the temperature system, pressure system, and vacuum system into an overall system to simulate the environment of the same test container. However, due to the ideal gas state equation: PV=nRT, in the same airtight container, That is, V remains unchanged, and there are two other variables P and T that interact with each other in the simulated high temperature and high pressure environment

When the operator sets one of the values, when setting another value, the value set later will have an impact on the previously set value. For example, if the pressure value P is set, it can be due to p=nRT / v , so, in the process of changing the temperature value T, it will lead to the change of the pressure value P, so it is difficult to simulate a specified high temperature and high pressure environment

[0004] The operation method of the high temperature and high pressure test is as follows: first heat the test container, and then pressurize it. In this way, once the cold gas enters the test container, it will suddenly expand, causing the surrounding medium to fail to satisfy the rapid expansion of the gas volume, which results in Huge potential safety hazard; and, since there is currently no device available for simultaneous high-temperature and high-pressure vacuum pumping tests on test vessels, operators need to move test samples from one test vessel to another during the simulation process of operating high-temperature and high-pressure vacuum pumping environments The test container is used to simulate the environment with different requirements, so as to conduct the test, which makes the operation method of simulating the high temperature and high pressure experimental environment too cumbersome

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