Local positioning method of one-dimensional material

Abstract

The invention discloses a local positioning method of a one-dimensional material. The method comprises the following steps: firstly, forming a wrapping layer which is formed by a wrapping material on the surface of the one-dimensional material, wherein the one-dimensional material is visible under an observation condition; and then, removing a local wrapping layer to be positioned on the one-dimensional material so as to form a wrapping section and a locally corresponding naked section on the one-dimensional material, wherein the one-dimensional material in the wrapping section is visible under the observation condition and the one-dimensional material in the naked section is exposed under the observation condition in the surrounding environment and is invisible. On this account, the wrapping section as a positioning mark can be used for positioning the invisible naked section, so that subsequent operations such as measurement of the heat conductivity of the one-dimensional material can be facilitated. Compared with the prior art, the invention provides a method for reversibly realizing visible one-dimensional material under an optical microscope. By virtue of the method, the one-dimensional material is operated, so that the actual application of the one-dimensional material is wide. The method is simple, practical and reversible in effect, and the physical property of the material is not affected after the material is recovered.

Description

technical field [0001] The invention relates to the technical field of nanomaterials, in particular to a local positioning method for one-dimensional materials. Background technique [0002] One-dimensional materials, especially one-dimensional nanomaterials, are materials that are extremely small in two geometric dimensions and approach or reach the macroscopic level in the other geometric dimension. This material has special excellent mesoscopic properties that some macroscopic materials do not have, such as excellent electrical properties that are highly sensitive to structure, and thermal and optical properties that are superior to macroscopic materials. Therefore, this material has broad application prospects. [0003] However, due to its extremely small size, its morphology can only be characterized by expensive equipment such as scanning electron microscopes or even transmission electron microscopes, and the steps are cumbersome, which requires high requirements on t...

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Problems solved by technology

[0006] In terms of optical performance measurement, due to the extremely small size of one-dimensional materials, the interaction area with light is very small, so the absorption cross-section and scattering cross-section are very small. According to the existing experimental equipment, the process of accurately detecting the optical signal of one-dimensional materials is complicated and difficult. The equipment required is expensive

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