Method for measuring axial heat conductivity of one-dimensional material

Abstract

The invention discloses a method for measuring axial heat conductivity of a one-dimensional material. The method comprises the following steps: forming a coating section and an exposed section adjacent to the coating section on the one-dimensional material, wherein the one-dimensional material is coated with a coating material different from the one-dimensional material on the coating section, and the one-dimensional material is exposed to an ambient environment on the exposed section; heating the one-dimensional material until the one-dimensional material reaches a thermal stabilization balance state; obtaining the positions at first and second reference points on the one-dimensional material and the temperatures in the thermal stabilization balance state at the first and second reference points, wherein the first reference point is an adjacent point at the adjacent part of the coating section and the exposed section, and the second reference point is another reference point, which is different from the adjacent point, of the exposed section; and calculating to obtain the heat conductivity according to the positions and the temperatures at the first and second reference points and based on a calculation relationship between pre-established heat conductivity and the positions and the temperatures at the first and second reference points. The disappearance edges of volatile substances are utilized as temperature indication coordinates, the measurement accuracy is high, and the measurement difficulty is reduced.

Description

technical field [0001] The invention relates to the technical field of nanometer materials, in particular to a method for measuring axial thermal conductivity of one-dimensional materials. Background technique [0002] One-dimensional materials, especially one-dimensional nanomaterials, are materials that are extremely small in two geometric dimensions and approach or reach the macroscopic level in the other geometric dimension. This material has special excellent mesoscopic properties that some macroscopic materials do not have, such as excellent electrical properties that are highly sensitive to structure, and thermal and optical properties that are superior to macroscopic materials. Therefore, this material has broad application prospects. [0003] However, due to its extremely small size, its morphology can only be characterized by expensive equipment such as scanning electron microscopes or even transmission electron microscopes, and the steps are cumbersome, which req...

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Problems solved by technology

[0006] In terms of optical performance measurement, due to the extremely small size of one-dimensional materials, the interaction area with light is very small, so the absorption cross-section and scattering cross-section are very small. According to the existing experimental equipment, the process of accurately detecting the optical signal of one-dimensional materials is complicated and difficult. The equipment required is expensive

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