Sample chamber of sample analysis device

A technology of sample analysis and sample chamber, which is applied in the direction of measuring devices, analyzing materials, and material analysis through optical means, can solve the problems of increasing maintenance difficulty and workload, limited space, and increasing processing costs, and achieves installation and maintenance. High maintenance and reset accuracy, convenient cleaning, and consistent results

Inactive Publication Date: 2015-03-25
SUZHOU TAOSPEC OPTRONICS
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  • Application Information

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Problems solved by technology

[0003] If the convenience of maintenance is not fully considered in the design, such as figure 2 As shown in the figure, the optical mounting assembly is directly installed on the mounting flange of the sample chamber cavity wall. After the optical components in the sample chamber are contaminated, they need to be disassembled for maintenance. Level, such maintenance usually requires the sample chamber and even the instrument to be returned to the factory as a whole, which is difficult to maintain and takes a long time, which seriously affects the use of users; for example, when designing, the optical components are directly installed on the wall of the sample chamber, so it is difficult to achieve optical High-precision installation of components, and poor repositionability after disassembly and maintenance
[0004] If the optical mounting component is directly mounted on the mounting flange of the sample chamber cavity wall through the positioning elements during design, since such positioning and optical path adjustment cannot be realized, the only way to obtain high-precision mounting of optical components is to improve the processing and assembly of the structural parts of the optical mounting component. Accuracy, which increases the processing cost, increases the difficulty of assembly technology, and brings difficulties for the company's subsequent quality control
[0005] Patent 201220707205.X proposes a method such as figure 1 As shown, a maintenance window is opened at both ends of the sample chamber, and the maintenance window sealing plate 1' is opened for maintenance. The maintenance is simpler and more convenient than before, but due to the limited space, the size of the maintenance window is limited. The dead angle and maintenance dead angle make the maintenance not thorough enough, but also increase the difficulty and workload of maintenance, and fail to achieve the purpose of fast and thorough maintenance of optical components
At the same time, because this method opens a window on the cavity wall of the sample chamber tube 2', the welding window is easy to deform the cavity wall of the sample chamber, resulting in the installation accuracy of the optical elements at both ends not meeting the requirements, and also making the processing of the cavity wall of the sample chamber difficult. Increased difficulty and additional cost

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Embodiment Construction

[0036] The optical components in the sample analyzer are easily contaminated by impurities in the sample during use. The existing cleaning method is to clean the optical components on the basis of disassembly and by opening a maintenance window on the wall of the sample chamber, but this method Due to the space and angle limitations of the maintenance window, there are dead angles for observation and cleaning, and the cleaning of the optical components is not thorough enough; if the optical components are disassembled and cleaned, there is no guarantee that the optical components can return to their original positions without the operation of professionals. In view of the above problems, the present invention discloses a sample chamber of a sample analysis device that can thoroughly clean the optical element and allow the optical element to be accurately assembled.

[0037] The technical solutions of the present invention will be further described in detail below through embodi...

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Abstract

The invention discloses a sample chamber of a sample analysis device. The sample chamber comprises an optical installation assembly and a sample chamber cavity wall, wherein a connecting piece is arranged between the optical installation assembly and the sample chamber cavity wall, one installation flange is arranged on the sample chamber cavity wall at least, the connecting piece is connected with the sample chamber cavity wall by the installation flange and is provided with a first location element, a second location element is arranged on the installation flange or the optical installation assembly, and the first location element and the second location element are matched with each other during installation to improve the installation and resetting precision of an optical element. According to the invention, the technical difficulties that an optical path needs to be regulated again after being maintained in a detached state and dead angles of maintenance are generated during maintenance through a window in the prior art are overcome, and the purpose of maintaining the optical element thoroughly and rapidly is fulfilled.

Description

technical field [0001] The invention belongs to the field of sample analysis and detection, and in particular relates to a sample chamber of a sample analysis device of an online analysis technology. Background technique [0002] In industrial on-line analysis, due to the complex composition of the sample, the optical components are extremely easy to be polluted. If it is not maintained in time, it will reduce the detection accuracy of the sample analysis device, and even damage the optical components, making them completely useless. [0003] If the convenience of maintenance is not fully considered in the design, such as figure 2 As shown in the figure, the optical mounting assembly is directly installed on the mounting flange of the sample chamber cavity wall. After the optical components in the sample chamber are contaminated, they need to be disassembled for maintenance. Level, such maintenance usually requires the sample chamber and even the instrument to be returned ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/15
Inventor 邓文平朱道龙
Owner SUZHOU TAOSPEC OPTRONICS
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