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Embedded overall control system for laser service life test instrument

A life test and control system technology, which is applied in the direction of optical instrument test, instrument, machine/structural component test, etc., can solve the problems of large-scale program development code and poor operability, and achieve friendly interface, complete functions and high use value Effect

Inactive Publication Date: 2015-04-01
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology

The system also adopts the control method based on the computer operating system to set up and collect information related to the life test process. Compared with the embedded control system, it also has the disadvantages of large-scale program development code and poor operability.

Method used

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  • Embedded overall control system for laser service life test instrument
  • Embedded overall control system for laser service life test instrument
  • Embedded overall control system for laser service life test instrument

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Embodiment Construction

[0018] In order to make the purpose, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, and do not limit the protection scope of the present invention.

[0019] An embedded overall control system for a laser life test instrument includes a man-machine interface module, an environment control module, a communication module and an integrated control module.

[0020] The man-machine interface module is a 10-inch LCD touch screen, which is physically connected to the communication module according to the ISO or TCP network management protocol. Through the function menu of the man-machine interface module, the initial setting and operation monitoring of key modules such as the environmental test chamber, drive power supply...

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Abstract

The invention discloses an embedded overall control system for a laser service life test instrument. The embedded overall control system is characterized in that under the situation that a computer operating system is not required, all key parts of the laser service life test instrument are controlled through assembling languages and integrating a PLC (Programmable Logic Controller) module, so that the functions of automatic setup of service life test initial parameters, automatic protection of test abnormal situations, automatic monitoring and acquisition of sensitive parameters and the like are achieved. Therefore, the system has the advantages of complete functions, high simplicity in operation, friendly interface and high cost-performance ratio and has a high use value in the industrial control field.

Description

technical field [0001] The invention relates to the technical field of network development, in particular to a website front-end development method and system. Background technique [0002] With the wide application of semiconductor lasers in optical communication, information storage, medical treatment, optical sensing, pumping solid-state lasers and fiber amplifiers, and the introduction of a large number of new products, the reliability of semiconductor lasers is gradually exposed. From an economic point of view, the failure of a device often affects the entire device or system, resulting in huge losses. From the perspective of safety, if a communication failure occurs in an aircraft or a spacecraft, it will cause immeasurable and heavy losses. Unreliable components can also be caused by communication interruptions, customer dissatisfaction, loss of reputation, and serious damage to national security. Therefore, it is very urgent, realistic and necessary to study the re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00
Inventor 路国光谢少锋肖庆中郝明明张林杰赖灿雄周振威
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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