Photoelectronic imaging system optical axis difference rapid detection method and device

Abstract

The invention discloses a photoelectronic imaging system optical axis difference rapid detection method and device. The method comprises the steps that a tested photoelectronic imaging system and a standard imaging system are used for acquiring images at the same time, any obvious feature target in the standard imaging system serves as the standard, a target image contour edge extraction and feature matching method is used for analyzing the difference of the same obvious feature target in the tested photoelectronic imaging system and the standard imaging system, and the difference of the aiming light of the tested photoelectronic imaging system is obtained. The device is used for implementing the method. The photoelectronic imaging system optical axis difference rapid detection method and device have the advantages that the principle is simple, operation is convenient, calibration accuracy is high, and calibration efficiency is high.

Description

technical field [0001] The invention mainly relates to the technical field of photoelectric imaging, in particular to a method and device for quickly detecting optical axis deviation among multiple photoelectric imaging systems. Background technique [0002] With the development of optoelectronic technology, electrical sensor systems such as laser rangefinders, laser-guided irradiation, visible light imaging, and infrared imaging have been widely used in optoelectronic image detection equipment in the fields of surveying and mapping, surveillance, early warning, guidance, remote sensing, and disaster relief. application. Among many applications, "optical axis pointing accuracy" has become an important parameter to measure the performance of multi-optical axis photoelectric equipment. The misalignment of the system also requires timely calibration of the optical axis during use. [0003] At present, the optical axis deviation detection equipment is difficult to adapt to the...

AI Technical Summary

Problems solved by technology

Calibration with this method usually takes several times to calibrate, the calibration process is cumbersome, the accuracy is poor, and the efficiency is low

[0006] (2) Laser red dot type calibration mirror: The calibration device emits laser light, and the crosshairs of the photoelectric equipment are manually adjusted to coincide with the red dot, and the calibration is completed, but the energy of the laser red dot is small, and the use conditions are limited. It is difficult to distinguish tens of meters away, and can only be used at dawn, dusk, and cloudy days, and the calibration device actively emits laser light, which is limited in many practical applications

This calibration method requires the use of complex instruments and equipment, the calibration process is cumbersome and slow, and the calibration accuracy can generally reach within 1MOA

[0008] In summary, in view of the existing calibration devices generally have many defects such as cumbersome calibration process, slow speed, low accuracy, poor repeatability, and poor environmental adaptability, there is an urgent need for a high-precision calibration device that can take into account both calibration accuracy and calibration efficiency accuracy. Quick Calibration

Images