Multi-model multi-interpolation lattice structure test automatic identification system
An automatic identification system and a technology of dot matrix structure, which is applied in the direction of electronic circuit testing, etc., can solve the problems of lack of technical support, fireworks that cannot meet user needs, and patterned fireworks that cannot be miniaturized.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.
[0021] refer to figure 1 and figure 2 As shown, the multi-type multi-insertion lattice structure testing machine automatic identification system includes a dot matrix structure testing machine 1 and a dot matrix structure quick plug and unplug connection dot matrix structure group 2, and the dot matrix structure is quickly plugged in The number of connected dot matrix structure groups 2 is more than one. The dot matrix structure testing machine 1 is provided with a dot matrix structure group plug-in installation socket 3, and the dot matrix structure group plug-in installation socket 3 is set. The number is more than one, and the dot matrix structure is quickly plugged and connected to the dot matrix structure group 2 to be plugged and installed in any pluggable installation position of the dot matrix structure group plug-in in...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com