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Two-dimensional contour fast registration method

A two-dimensional outline and fast technology, applied in image data processing, instruments, calculations, etc., can solve problems such as the need to improve the accuracy and the limitation of the application range, and achieve the effect of wide application range and stable registration

Inactive Publication Date: 2015-05-27
BEIHANG UNIV
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Problems solved by technology

Since this method is based on SVD decomposition, not all matrices can be decomposed by SVD, and it cannot be decomposed by SVD for linear and singular data sets, so the application range of the prior art 1 has limitations.
[0007] Prior Art 2 Since the translation parameter is expressed as a function of the rotation parameter when constructing the unit quaternion matrix, the calculation of the rotation parameter has a better accuracy, but the calculation of the translation parameter needs to be improved.

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Embodiment Construction

[0034] See figure 1 , figure 2 , a two-dimensional contour rapid registration method of the present invention, the specific implementation steps are as follows:

[0035] Step 1. Existing target data point set P i (i=1,2,...,n), there are n target data points, the reference data point set comes from the input DXF graphic file, and the target data point set comes from the measuring point data measured by the measuring instrument;

[0036] Step 2: Take a point P in the target data point set i (x i ,y i ), looking for a point in the set of reference data points make point P i arrive The shortest distance is to calculate the corresponding point in the reference point set Make Minimum, according to this method, the corresponding point can be found in the reference point set for each point in the target data. Suppose there is a rotation matrix and a translation vector, the target data point set P i (x i ,y i ) through this transformation to get a new set of data poi...

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Abstract

The invention relates to a two-dimensional contour fast registration method. The two-dimensional contour fast registration method comprises six major steps: step 1, setting a reference data set and a target data set; step 2, for each point in the target data set, seeking a point with the shortest distance corresponding to the point from reference data set in a centralized manner; step 3, establishing a matching target function; step 4, optimizing the target function, and figuring out an optimal solution of the target function to obtain a new target data set; step 5, performing error analysis and calculation, and if error conditions are met or a maximum number of iterations is reached, going to the step 6, and otherwise, going to step 2, step 6, outputting an error analysis report according to a matching relation after the optimal matching relation is obtained, and realizing two-dimensional contour fast registration. The invention provides the two-dimensional contour fast registration method to realize an ICP (iterative closest point) algorithm, by adopting the method, curve contour registration is efficiently and stably realized, and the method provided by the invention is widely applied to measurement and detection of workpieces after processing, reconstruction of surfaces, identification of three-dimensional objects, calibration of cameras and the like.

Description

technical field [0001] The present invention relates to a two-dimensional (2D) outline rapid registration method, in particular to the rapid, efficient and stable registration of curved outlines. The invention belongs to the field of computer application technology. Background technique [0002] Iterative Closest Point (ICP) is a registration method based on free-form surfaces proposed by American scholars Besl and Mckay in 1992 for point set data registration. This algorithm is based on knowing two point sets and an initial assumption of corresponding relationship, using the corresponding point set registration technology for registration, iteratively and minimizing the corresponding point registration error algorithm. Compared with the registration method between corresponding point sets, the biggest advantage of the ICP algorithm is that it does not need to know the exact correspondence between two point sets, but starts an iterative operation based on a hypothetical cor...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
Inventor 宁涛陈志同黄方
Owner BEIHANG UNIV
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