Two-dimensional contour fast registration method
A two-dimensional outline and fast technology, applied in image data processing, instruments, calculations, etc., can solve problems such as the need to improve the accuracy and the limitation of the application range, and achieve the effect of wide application range and stable registration
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[0034] See figure 1 , figure 2 , a two-dimensional contour rapid registration method of the present invention, the specific implementation steps are as follows:
[0035] Step 1. Existing target data point set P i (i=1,2,...,n), there are n target data points, the reference data point set comes from the input DXF graphic file, and the target data point set comes from the measuring point data measured by the measuring instrument;
[0036] Step 2: Take a point P in the target data point set i (x i ,y i ), looking for a point in the set of reference data points make point P i arrive The shortest distance is to calculate the corresponding point in the reference point set Make Minimum, according to this method, the corresponding point can be found in the reference point set for each point in the target data. Suppose there is a rotation matrix and a translation vector, the target data point set P i (x i ,y i ) through this transformation to get a new set of data poi...
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