The invention relates to a two-dimensional contour fast registration method. The two-dimensional contour fast registration method comprises six major steps: step 1, setting a reference
data set and a target
data set; step 2, for each point in the target
data set, seeking a point with the
shortest distance corresponding to the point from reference data set in a centralized manner; step 3, establishing a matching target function; step 4, optimizing the target function, and figuring out an optimal solution of the target function to obtain a new target data set; step 5, performing
error analysis and calculation, and if error conditions are met or a maximum number of iterations is reached, going to the step 6, and otherwise, going to step 2, step 6, outputting an
error analysis report according to a matching relation after the
optimal matching relation is obtained, and realizing two-dimensional contour fast registration. The invention provides the two-dimensional contour fast registration method to realize an ICP (
iterative closest point)
algorithm, by adopting the method, curve contour registration is efficiently and stably realized, and the method provided by the invention is widely applied to measurement and detection of workpieces after
processing, reconstruction of surfaces, identification of three-dimensional objects, calibration of cameras and the like.