Method and system for monitoring transmission line impulse electrostatic discharge test response

Abstract

The invention relates to a method and a system for monitoring the pulse electrostatic discharge test response of a transmission line. When the TLP test system applies transmission line pulses of different pulse voltages to electronic components, a light emission microscope collects the light emission images of the pulse discharge process of each transmission line, Therefore, at the end of the test, each light emission image and the optical reflection image are superimposed to precisely locate the electrostatic discharge channel and damage point of the electronic components. The invention realizes the real-time monitoring of the electroluminescence phenomenon during the pulse electrostatic discharge test of the transmission line, which is convenient for clarifying the electrostatic discharge channel inside the electronic components during the electrostatic discharge test, timely discovering and accurately locating the damage point of the electrostatic discharge, so as to determine the product Antistatic weak link. In addition, the test information of the present invention is fully utilized, and the test steps are simple, which can provide good technical support for electrostatic damage research of electronic components and ESD design improvement, and has good engineering application value.

Description

technical field [0001] The invention relates to the technical field of electrostatic discharge testing of electronic components, in particular to a method for monitoring the response of a transmission line pulse electrostatic discharge test and a system for monitoring the response of a transmission line pulse electrostatic discharge test. Background technique [0002] Transmission Line Pulse (TLP) test refers to the use of transmission lines to generate short pulses (50 nanoseconds to 200 nanoseconds) to measure the current / voltage of ESD (Electro-Static discharge, electrostatic discharge) protection structures in electronic components characteristic method. A transmission line of constant impedance produces a square wave of constant amplitude. The short pulses generated by the TLP test are used to simulate short ESD pulses on electronic components. By using short pulses, the current passing through the tested sample and the voltage applied to the sample can be accurately ...

AI Technical Summary

Problems solved by technology

However, damage to electronic components caused by electrostatic discharge tests may have various degrees of burnout

When the degree of burn is relatively small and the burn area is small, the burn phenomenon cannot be observed by optical microscope or scanning electron microscope, so the damage point location cannot be realized

When the burnt degree is serious and the burnt area is large, it is difficult to accurately locate the initial damage position of the device by optical microscope or scanning electron microscope observation

In addition, the existing technical solutions also have shortcomings such as many test steps, long test time, and insufficient use of test information.

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