24 results about "Electrostatic Discharge Testing" patented technology

The utility model relates to the technical field of test tools, in particular to an electrostatic discharge tester fixing tool, which is characterized in that a portal frame is fixed on a base, a vertical lifting sliding table is arranged below the portal frame in a sliding manner, a horizontal product carrying plate is connected to the vertical lifting sliding table, and the product carrying plate is used for placing a product to be tested; a first clamping plate is fixed to the portal frame, a first support plate is vertically fixed to the first clamping plate, a second support plate is vertically fixed to the first support plate, a second clamping plate is connected to the inner side of the second support plate through an adjusting screw, and the position of the second clamping plate corresponds to the position of the first clamping plate. An ESD experimental instrument is clamped and fixed between the second clamping plate and the first clamping plate; the portal frame is connected with an LED lighting assembly used for lighting a product. Compared with the prior art, the fixing jig for the ESD tester has the advantages that by arranging a clamping structure for an ESD experimental instrument, the handheld operation fatigue can be effectively relieved, the product carrier plate can horizontally move and lift, the accurate alignment of an instrument gun head and a product can be favorably realized through the LED illumination and the magnifying glass, and the working efficiency is improved.

The invention discloses a multi-type chip pin positioning method based on binocular vision and a related device, which are applied to alignment of a probe and a chip pin in an electrostatic discharge test, and the method comprises the following steps: obtaining a binocular vision image of a chip to be tested in a CDM discharge test; inputting the binocular vision image of the to-be-tested chip into a pre-trained chip identification model to obtain a chip identification result; performing image processing on the chip contour according to the chip packaging type to obtain a chip pin contour and a pin center point; obtaining the three-dimensional coordinates of the center points of the corresponding pins based on the distance between the center points of the same pin in the binocular vision image; wherein the chip identification model is obtained by improving a YOLOv8n model, and the improvement method comprises the following steps: replacing a Bottleneck structure of a C2f module in the YOLOv8n model by using Faster Block, so that accurate and unmanned chip pin positioning is realized.

The present invention discloses an electrostatic discharge test method, device, and preparation method thereof. The method comprises: connecting the first electrode of a first test board to the charging electrode at the corresponding position of a second test board in a one-to-one manner; connecting the first electrode area of the first test board and the charging electrode area of the second test board to a charge-discharge conversion module via wires; adjusting the charge-discharge conversion module to a charging mode to charge the first test board; connecting the two electrodes of each chip of a wafer to be tested to the first electrode and the second electrode of the first test board in a one-to-one manner; connecting the first electrode area of the first test board and the second electrode area of the first test board to the charge-discharge conversion module via wires; adjusting the charge-discharge conversion module to a discharge mode to perform an electrostatic discharge test on the wafer to be tested. The present invention can solve the technical problems of low efficiency and high cost of electrostatic discharge testing of each light-emitting diode chip in the prior art.

The utility model discloses a diaphragm electrostatic discharge testing device, which comprises a base, the top of the base is provided with a supporting bottom plate and a coupling plate, the middle parts of the two ends of the supporting bottom plate in the X-axis direction are respectively connected with a sliding base in a sliding manner, and the two sliding bases are respectively provided with a discharge terminal. The two groups of sliding bases can adjust the distance between the two groups of discharging terminals; two groups of diaphragm clamping plates are vertically arranged in the Y-axis direction of the supporting bottom plate, the two groups of diaphragm clamping plates are used for clamping a diaphragm sample to be tested and are positioned between the two groups of discharge terminals, one end of each discharge terminal is an electrostatic discharge applying end, and the other end of each discharge terminal is connected with the coupling plate. The discharge position of the diaphragm can be adjusted, the purpose of accurately positioning the diaphragm is finally achieved, the discharge state of the diaphragm in the actual machining and using process is simulated, the electrostatic discharge performance of the diaphragm can be screened in the early stage, the quality of the diaphragm is improved, and then the quality of a battery cell is improved.

Provided herewith is a new bimodal solid-state pulse generating system to generate ESD pulses for the ESD test, and narrow high-speed pulses for high-speed pulsed I-V characterization of electronic components. Accordingly, the bimodal solid-state pulse generating system is capable of operating in a dual-polarity electrostatic discharge testing mode and a pulsed I-V characterization mode respectively. In comparison with the conventional toxic mechanical mercury relay, not only is the new system display equivalent or superior performance in terms of high-speed pulse generation, but the new system also eliminates the drawbacks of the toxic mechanical mercury relays on the maximum operating cycles, and their toxicity and environmental hazard.

The present application proposes a test device for performing electrostatic discharge testing and radio frequency testing on compatible chips, the test device comprising: a first test board comprising: a chip placement area for placing the chip to be tested; a plurality of first rows of pinholes for electrically connecting to the pins of the chip to be tested, the pins including radio frequency input pins and voltage input pins; a second test board comprising: a peripheral circuit area for placing the peripheral circuit of the chip to be tested; a plurality of second rows of pinholes connected to the plurality of first rows of pinholes, the plurality of second rows of pinholes including voltage pinholes and radio frequency pinholes, the voltage pinholes being used to connect the peripheral circuit and connected to the voltage input pins through the first row of pinholes; the radio frequency pinholes being used to connect to a radio frequency tester and connected to the radio frequency input pins through the first row of pinholes.

The invention provides an electrostatic discharge test device and method, and the device comprises an electrostatic discharge generation part which is used for emitting electrostatic voltage to a to-be-tested object; and the ion fan is connected with the electrostatic discharge generation part, and the ion fan is used for removing residual charges on the surface of the to-be-detected object. By using the ion fan, residual charges on the surface of the to-be-tested object can be quickly neutralized without depending on manual operation of an operator, so that interference of human factors is reduced, the consistency of charge states on the surface of the to-be-tested object before each test is ensured, and the test efficiency is improved. The problems that in the prior art, a traditional ESD testing method and device are poor in operation repeatability, and testing conditions are difficult to be consistent are solved.

An electrostatic discharge (ESD) test system disclosed herein comprises: a robot arm including a plurality of joints bent in various directions; an electrostatic discharge (ESD) gun coupled to one end of the robot arm and including a first coupling portion; and a discharge tip including a second coupling portion coupled to the first coupling portion, wherein the first coupling portion includes a first magnet, the second coupling portion includes a second magnet, the first magnet and the second magnet are coupled at a first angle, and a fastening force weakens or a repulsive force is provided at a second angle. The electrostatic discharge (ESD) test system can perform electrostatic discharge tests on electronic devices ranging from small to large devices, thus enabling consistent and accurate testing.

A test device includes an electrostatic discharge test circuit electrically connected to at least one subject, a frame configured to accommodate the at least one subject and the electrostatic discharge test circuit, a transport device configured to move, the movement of the transport device causing the frame to move, and processing circuitry configured to, control the movement of the transport device such that the electrostatic discharge test circuit becomes electrically connected to a power supply device based on a position of the transport device, and control the movement of the transport device such that the at least one subject becomes electrically connected to a host device based on the position of the transport device.

The utility model relates to the technical field of electromagnetic compatibility testing, in particular to an electrostatic discharge testing circuit, a circuit board and testing equipment. The electrostatic discharge test circuit comprises a first switch module, an energy storage module, a second switch module and a test port, wherein the test port is in contact with a tested signal line of a circuit board to be tested. The first switch module is connected with a power supply. And the first switch module is switched on when receiving the charging signal, so that the power supply can charge the energy storage module through the first switch module. And the second switch module is switched on when receiving the trigger signal, so that the energy storage module outputs a test signal to the tested signal line through the test port. According to the circuit, a single excitation function is realized through trigger signal control of the second switch module, an electrostatic discharge test can be excited in a single time by providing a single trigger signal, and the problem that interference pulses are continuously output in a traditional test instrument is avoided; based on the single excitation function, the response condition of the circuit board to be tested under the electrostatic discharge impact can be analyzed more accurately.

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. A first peak-to-peak voltage signal is detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board having the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signal, and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.

Solid state ESD SIC simulator. An electrostatic discharge (ESD) test system includes a FET-based pulse generator that uses a pair of back-to-back FETs coupled to generate an ESD pulse based on discharging a capacitor coupled in series with a device under test (DUT). A number of FETs can be selected based on an expected ESD test voltage amplitude.

The invention discloses an anti-static detection method for new energy automobile part production, and relates to the technical field of anti-static detection for automobile part production, an electrostatic discharge detection module is used for carrying out electrostatic discharge test on a current part at different temperatures, a detection state condition is collected, and an evaluation calculation module is used for evaluating the detection state condition. An electrostatic discharge energy evaluation value FN, an anti-static performance index FX and a comprehensive anti-static performance evaluation value FZ are sequentially calculated and output, and then the comprehensive anti-static performance evaluation value FZ detected and output at different temperatures is sorted and evaluated based on the comprehensive anti-static performance evaluation value FZ by using a data comparison and sorting analysis unit. According to the method, the harm of electrostatic discharge can be quantified, the anti-static performance can be comprehensively evaluated, the dynamic change of the anti-static performance can be reflected, and powerful support is provided for production and maintenance of new energy automobile parts.

The application relates to the technical field of electrostatic discharge testing, and discloses an electrostatic discharge testing device, which comprises a track arranged on a surface to be tested; a moving device slidably connected to the track, wherein the moving device is provided with a transmission belt; a trigger member arranged on the transmission belt and moving along the transmission belt in a first direction, wherein the first direction is perpendicular to the surface to be tested; a static electricity removing assembly arranged on the transmission belt and moving along the transmission belt in a second direction, wherein the second direction is parallel to the surface to be tested; wherein an electrostatic gun is arranged on the trigger member and moves along the transmission belt along with the trigger member, when the electrostatic gun moves along the transmission belt along with the trigger member towards the surface to be tested, the static electricity removing assembly is driven to move along the transmission belt away from the surface to be tested, after the testing is completed, the trigger member is reset, and the static electricity removing assembly is reset to wipe off the electric charges on the surface to be tested.

The utility model provides an electrostatic discharge test system. The electrostatic discharge test system comprises a transfer device, an electrostatic discharge assembly, an object positioning device, a tool electrifying device, a detection device and a test board, the electrostatic discharge assembly comprises an indirect discharge device and an air discharge device; the object positioning device comprises a first object power-on device and a second object power-on device, the first object power-on device is provided with a first object power-on tool, and the second object power-on device comprises a second object power-on tool. According to the utility model, compatible detection of various objects can be realized, and various test links of direct discharge, indirect discharge and air discharge can be realized.

The utility model discloses a camera, which comprises a shell, a lens and a conductor, and is characterized in that the shell is provided with a mounting hole; the lens is at least partially mounted in the mounting hole; the conductive member is arranged in the mounting hole and is in contact with the lens and the housing. Compared with the prior art, the camera module has the advantages that the lens and the shell are conducted through the conductive part, current can be guided to the shell from the lens through the conductive part in an electrostatic discharge test, the current is prevented from being guided to a circuit board, an electrostatic conduction route is optimized, and functional safety of the camera module is guaranteed. The conductive member is mounted between the lens and the hole wall of the mounting hole and is in contact with the exposed part of the lens and the hole wall of the mounting hole, so that the conductive member can perform electrostatic conduction between the lens and the shell conveniently, and in an electrostatic discharge test, static electricity is guided to the shell.

The utility model provides an electrostatic discharge test system including an electrostatic discharge generation module, a relay matrix, a test seat, a source meter and a residual voltage discharge module, the electrostatic discharge generation module is connected with the test seat through the relay matrix, the source meter is connected with the test seat through the relay matrix, and the residual voltage discharge module is connected with the test seat. The electrostatic discharge generation module is used for generating test voltage; the relay matrix is used for controlling the on-off between the test seat and the electrostatic discharge generation module, and the relay matrix is used for controlling the on-off between the test seat and the source meter; the test seat is used for placing a to-be-tested chip, the source meter is used for measuring an IV curve of the to-be-tested chip, and the residual voltage discharge module is used for releasing residual voltage of the to-be-tested chip. According to the electrostatic discharge test system provided by the utility model, the test seat is connected with the electrostatic discharge generation module and the source meter through the relay matrix, and manual switching is replaced by the relay matrix, so that the electrostatic discharge test process is simplified, and the test reliability and efficiency are improved.

The utility model relates to the technical field of power equipment, in particular to an electrostatic discharge simulator with a protection function. The electrostatic discharge simulator with the protection function provided by the utility model comprises two mounting plates, and the number of the mounting plates is two. The electrostatic discharge simulator is mounted between the upper side surfaces of the two mounting plates; the supporting frame is located on the right side of the electrostatic discharge simulator; the automatic electrostatic discharge gun is placed on the support frame; the mute shell is connected to the lower side face of the supporting frame, and the electrostatic discharge simulator and the automatic electrostatic discharge gun are located in the mute shell. According to the utility model, the electrostatic discharge simulator is limited through the limiting plate, the electrostatic discharge simulator and the automatic electrostatic discharge gun cooperate to carry out an electrostatic discharge test on a tested device, and the metal shielding cavity and the mute housing can protect the electrostatic discharge simulator and the automatic electrostatic discharge gun and absorb and reduce noise.

This application provides an electrostatic discharge (ESD) testing system for an Ethernet interface, relating to the field of ESD testing. The system includes: an excitation source device, an Ethernet interface simulation device, and a testing device; the Ethernet interface simulation device is connected to both the excitation source device and the testing device; the Ethernet interface simulation device is a printed circuit board simulating the Ethernet interface of a domain controller; the excitation source device generates a first current conforming to an ESD waveform and injects this first current into the Ethernet interface simulation device; the testing device acquires the output voltage of the Ethernet interface simulation device. Compared to related technologies that rely on prototype testing of domain controllers, the method of this application reduces the complexity of ESD testing for the Ethernet interface of a domain controller.

The embodiment of the present application is applicable to the field of electrostatic testing, and provides a testing method and electronic device for interference signals, which are applied to an electrostatic discharge (ESD) testing system. The ESD testing system includes an electrostatic generator, an electronic device to be tested, and a signal detection device. The method includes: obtaining a first voltage signal, a second voltage signal, and a third voltage signal, and then obtaining a first interference signal between a first detection point and a second detection point based on the first voltage signal, the second voltage signal, and the third voltage signal. In the embodiment of the present application, the interference signal brought by the probe, the differential amplifier module, and the sampling circuit inside the signal detection device in the signal detection device can be corrected by accessing the first voltage signal and the second voltage signal with different directions, and the interference signal introduced in the circuit loop between the first detection point and the second detection point can be corrected by the insulating device, thereby improving the accuracy of the first interference signal.

The invention provides a light-emitting diode screening method, which comprises the following steps of: providing a wafer which is provided with a plurality of light-emitting diode structures; testing each light emitting diode structure on the wafer through wafer-level electrostatic discharge; testing each light emitting diode structure on the wafer by wafer-level collapse voltage; testing the light emitting diode structures on the wafer according to wafer-level photoelectric characteristics; splitting the light emitting diode structures on the wafer to form a plurality of light emitting diode crystal grains; and excluding a part of the light emitting diode crystal grains with abnormity, wherein the abnormity comprises one of electrostatic discharge test abnormity, collapse voltage test abnormity, photoelectric characteristic test abnormity and appearance abnormity.

The invention provides an electrostatic discharge test structure, a test method and a chip, the test structure comprises an electrostatic discharge protection device and a protected device, the positive electrode of the electrostatic discharge protection device and the positive electrode of the protected device are jointly connected with a second test pad, and the negative electrode of the electrostatic discharge protection device is connected with a first test pad. And the cathode of the protected device is connected with the third test pad. The test pads are coupled, the typesetting layout area of the electrostatic discharge test structure is reduced, meanwhile, the first test pad, the second test pad and the third test pad are adopted to carry out TLP characteristic test on the electrostatic discharge test structure, the effective pulse current in the effective window of the electrostatic discharge protection device can be accurately measured, and the test accuracy is improved. The method does not excessively depend on test hardware, makes up for the defects of test in the industry, is not affected by parasitic internal resistance of a machine and the like, and does not need calculation.

The application discloses a multi-type chip pin positioning method based on binocular vision and a related device, which is applied to the alignment of probes and chip pins in electrostatic discharge testing, and the method comprises the following steps: acquiring a binocular vision image of a chip to be tested in CDM discharge testing; inputting the binocular vision image of the chip to be tested into a pre-trained chip recognition model to obtain a chip recognition result; performing image processing on a chip contour according to a chip packaging type to obtain a chip pin contour and acquire a pin center point; obtaining three-dimensional coordinates of corresponding pin center points based on the distance between the same pin center points in the binocular vision image; wherein the chip recognition model is obtained by improving a YOLOv8n model, and the improvement method comprises the following steps: replacing a Bottleneck structure of a C2f module in the YOLOv8n model with a FasterBlock, so that accurate and unmanned chip pin positioning is realized.

The embodiment of the utility model relates to the field of electrostatic discharge test, and discloses a test circuit board, which comprises a connection interface and a test module, the connection interface is in communication connection with the test module; the connection interface is configured to be connected with a test device and transmit an electrostatic discharge pulse sent by the test device to the test module so as to perform an electrostatic discharge test on the test module. According to the scheme, the plurality of connection interfaces and the test module are integrated into one test circuit board, so that the test circuit board can represent the electrostatic discharge test of the electronic product main body circuit board. Compared with the situation that signal interference or main body circuit board scrapping is easily caused by direct ESD test on the interface of the main body circuit board of the electronic product, the scheme is used for testing the test circuit board, interference of electrostatic discharge pulses on other signal circuits can be effectively avoided, the cost for testing the scrapped test circuit board through electrostatic discharge is reduced, and the test efficiency is improved. And the test is safer.