A detection method for microscopic residual stress of metal matrix composites
A composite material and residual stress technology, which is applied in the direction of analyzing materials, using wave/particle radiation for material analysis, measuring devices, etc., can solve the problems that cannot meet the requirements of residual stress detection, etc.
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Embodiment 1
[0066] The detection material is a three-dimensional network reinforced SiC3D / Al metal matrix composite material. The detection process is as follows: use a thermal field emission electron microscope, cooperate with the EBSD system, select the SiC / Al interface for the detection area, and deduce the in-situ misorientation within the range of 0.5° to 5° Distribution data; such as figure 1 shown. Select the direction perpendicular to the SiC / Al interface as the detection direction, that is, the X-axis direction, and divide the sub-regions. The width of the sub-regions is 1 μm.
[0067] For each sub-region, the values of all detection points on the X axis are characterized by a unique X value, and the values of all detection points on the X axis are averaged to obtain a unique X value;
[0068] The in-situ misorientation distribution data of each sub-region is expressed as (f i , i), i is the in-situ orientation difference value of any detection point in the sub-region, and ...
Embodiment 2
[0072] The detection material is a particle-reinforced SiCp / Cu metal matrix composite material. The detection process is as follows: use a cold field emission electron microscope, cooperate with the EBSD system, select the SiC / Al interface for the detection area, and derive the in-situ misorientation distribution data within the range of 0.5° to 5° ;Such as Figure 4 shown. Select the direction perpendicular to the SiC / Cu interface as the detection direction, that is, the X-axis direction, and divide the sub-regions. The width of the sub-regions is 1 μm.
[0073] For each sub-region, the values of all detection points on the X axis are characterized by a unique X value, and the values of all detection points on the X axis are averaged to obtain a unique X value;
[0074] The in-situ misorientation distribution data of each sub-region is expressed as (f i , i), i is the in-situ orientation difference value of any detection point in the sub-region, and i takes 0.5°~5°; f ...
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