Topology Reconstruction Method of α-shape Surface from Sample Points of Real Objects

A kind of sample point and physical object technology, applied in the field of product reverse engineering, can solve the problems of low reconstruction efficiency and other problems, and achieve the effect of improving correctness, improving completeness and maintaining accuracy

Inactive Publication Date: 2018-06-01
SHANDONG UNIV OF TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to solve the main problems existing in the current α-shape algorithm, and propose a method for reconstructing the surface topology of the α-shape surface of the physical surface sample point, optimize the surface reconstruction results, and do not significantly reduce the reconstruction efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Topology Reconstruction Method of α-shape Surface from Sample Points of Real Objects
  • Topology Reconstruction Method of α-shape Surface from Sample Points of Real Objects
  • Topology Reconstruction Method of α-shape Surface from Sample Points of Real Objects

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0045] Embodiment one: to Figure 15 The sample points on the surface of the mechanical parts shown in , are reconstructed using the surface topology reconstruction method described in the present invention. Figure 15 The sample point set shown contains 55685 sample points, including edge features, boundary features and free-form surfaces, and is a point set with a large degree of overall non-uniform distribution. The reconstruction method of the present invention optimizes the gain of the local samples of the curved surface. The sample point distribution information in the sparse area of ​​sampling data is more fully obtained, which can make the adjustment of the α-shape scale threshold more accurate, and avoid the overestimation of the sample point density due to the serious deviation of the local samples of the surface from the sampled data-intensive area. It can effectively reduce the defects caused by mistaken deletion. from Figure 16 From the reconstruction results o...

Embodiment 2

[0046] Embodiment two: to Figure 17 The sample points on the surface of the real object shown in - the Rabbit point cloud model are reconstructed by using the surface topology reconstruction method described in the present invention. Figure 17 The point cloud model shown contains 34,834 samples, the overall distribution is approximately uniform, and the local area is non-uniform due to large curvature changes, and there are sharp edges on the edge of the ear, because this paper can obtain a better local surface in the case of non-uniformity samples are used in the surface topology reconstruction process, so Figure 18 The overall reconstruction results and the reconstruction effect of the ear edge are good. The number of patches in the reconstructed mesh model is 100163, and the reconstruction time is 11.82 seconds.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method for reconstructing the surface topology of a physical surface sample point α-shape surface, which belongs to the field of product reverse engineering, and is characterized in that: constructing the Delaunay grid subdivision of the physical surface sample point and constructing a spatial index KD tree; solving the correspondence of each surface α‑shape scale threshold interval, to obtain the set of the left end point and the right end point of the interval; select the patch with the minimum sum of the interval endpoints as the initial patch; obtain the local sample of the gain-optimized surface to estimate the distribution density of the sample points, according to the sample The point distribution density is adaptively adjusted by the α-shape scale threshold, and then the Delaunay patch filtering is performed to obtain the initial mesh surface; the external mesh patch of the initial mesh is extracted to obtain a two-dimensional manifold mesh. The method of the present invention makes the obtained grid surface basically free of holes and edge dents, can better maintain the shape and position accuracy of edge features, can reduce non-manifold patches in the initial filtering results, and has high reconstruction efficiency at the same time .

Description

technical field [0001] The invention provides an α-shape curved surface topology reconstruction method of sample points on the surface of an object, which can be used to construct a grid surface model of sample points on the surface of an object, and belongs to the field of reverse engineering of products. Background technique [0002] Surface topology reconstruction, also known as surface reconstruction, is the core technology of reverse engineering. It mainly solves the problem of restoring the adjacency relationship of physical surface samples that only contain coordinate information and are scattered. . The shape and location accuracy of the reconstruction results of the edge features of the sample points on the physical surface have an important impact on the subsequent design analysis and remanufacturing process. However, the current surface topology reconstruction technology cannot realize the accurate reconstruction of the edge features, and the data volume exceeds t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06T17/30
Inventor 孙殿柱魏亮李延瑞薄志成
Owner SHANDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products