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Apparatus and method for testing contact resistance of conductive slip ring automatically

A conductive slip ring and contact resistance technology, which is applied in the direction of measuring devices, measuring resistance/reactance/impedance, measuring electrical variables, etc., can solve problems such as inability to meet large-scale production requirements, low test efficiency, etc., and eliminate individual test errors , fast test, and the effect of meeting the speed requirements

Active Publication Date: 2015-08-19
MIANYANG WEIBO ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The usual test method for conductive slip rings is that testers test the wire ends of the contact points of conductive slip rings with special low-resistance test instruments, and then read the values ​​of the test instruments and record them manually. Due to the individual differences of testers, this method is extremely difficult. It is easy to produce measurement errors, and general slip ring products have multiple channels (wind power conductive slip rings have as many as 29 channels), so the test efficiency is extremely low and cannot meet the requirements of large-scale production

Method used

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  • Apparatus and method for testing contact resistance of conductive slip ring automatically
  • Apparatus and method for testing contact resistance of conductive slip ring automatically
  • Apparatus and method for testing contact resistance of conductive slip ring automatically

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Embodiment Construction

[0025] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0026] Such as figure 1 As shown, the present invention is a device for automatically testing the contact resistance of a conductive slip ring, which includes a tested conductive slip ring 1 , a relay 2 , a low resistance tester 3 , an automatic control device 4 , and a relay driver 5 . The conductive slip ring 1 to be tested is connected to the relay 2, the output of the relay 2 is connected to the test input of the low resistance tester 3, the low resistance tester 3 is connected to the automatic control device 4 through RS232, and the automatic control device 4 is connected to the relay 2 through the relay driver 5 Connect and control relay 2.

[0027] Such as figure 2 As shown, the present invention is a device for...

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Abstract

The invention discloses an apparatus and method for testing contact resistance of a conductive slip ring automatically. A low-resistance tester is arranged outside the apparatus. The apparatus comprises a conductive slip ring, a plurality of relays, a relay drive circuit, an automatic control device, and a plurality of leads. The number N of the relays is twice the number M of channels of the conductive slip ring; the N relays are connected with all M channels of the conductive slip ring to form switching of 2N testing channels; each four adjacent relays complete switching of two four-wire measurement channels. The output terminal of the relay drive circuit is connected with the relays and the input terminal is connected with the automatic control device. According to the invention, with the simple relay switching circuit, rapid testing of contact resistances of multiple paths can be realized; and the individual test error can be eliminated.

Description

technical field [0001] The invention relates to the technical field of low-resistance testing, in particular to a device and method for automatically testing the contact resistance of a conductive slip ring. Background technique [0002] Conductive slip ring is a precision power transmission device that realizes signal and current transmission between two relative rotating mechanisms. Applications where unrestricted, continuous or intermittent rotation is required while transferring power or data from a fixed position to a rotating position. The variation of dynamic contact resistance is a key parameter index of the conductive device during the test process. It refers to the maximum variation of the contact resistance when the brush and the ring rotate relative to each other, expressed as the difference between the maximum value and the minimum value. difference, the smaller the difference, the better. [0003] The usual test method for conductive slip rings is that tester...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
Inventor 许永衡李勇张强
Owner MIANYANG WEIBO ELECTRONICS
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