Test fixture for single layer capacitor

A technology for testing fixtures and capacitors, which is applied in the field of capacitors, can solve problems such as the efficiency of capacitor electrode damage testing, and achieve the effects of improving test efficiency, reducing equipment costs, and clamping reliability

Active Publication Date: 2015-09-16
江苏伊施德创新科技有限公司
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  • Abstract
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Problems solved by technology

[0004] In view of the above problems, the present invention provides a test fixture for single-layer capacitors, which effectively solves the problems that existing fixtures will cause damage to capacitor electrodes and low test efficiency, and realizes non-destructive testing and aging of single-layer capacitors. , which simplifies the pick-and-place operation of single-layer capacitors in the testing and aging process, improves production efficiency, and reduces equipment costs

Method used

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  • Test fixture for single layer capacitor
  • Test fixture for single layer capacitor
  • Test fixture for single layer capacitor

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Embodiment Construction

[0024] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0025] See figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 , Figure 6 , Figure 7 , Figure 8 The test fixture for single-layer capacitance of the present invention includes two upper electrode plates 1 and lower electrode plates 2 arranged in parallel with each other, and probes are respectively arranged between the upper electrode plate 1 and the lower electrode plate 2, and the probes The upper and lower sides cooperate to clamp the single-layer capacitor, and the plane contact area of ​​the probe tip of the probe is larger than the electrode area of ​​the single-layer capacitor.

[0026] The upper electrode plate 1 and the lower electrode plate 2 respectively include an upper base 3 and a lower base 4. The upper base 3 and the lower base 4 are respectively provided with probe mounting holes 5, and the probes are correspondi...

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Abstract

The invention provides a test fixture for a single layer capacitor, so as to effectively solve problems that the prior fixture causes damages to a capacitor electrode and the test efficiency is low, realize undamaged test and aging on the single layer capacitor, simplify taking and placing operation during the test and aging steps of the single layer capacitor, improve the production efficiency and reduce equipment cost. The test fixture for the single layer capacitor comprises two electrode plates arranged in a mutually parallel mode, and is characterized in that probes are relatively arranged between the electrode plates respectively, the probes clamp the single layer capacitor in a vertical matching mode, and the plane contact area of probe ends of the probes is larger than the electrode area of the single layer capacitor.

Description

technical field [0001] The invention relates to the technical field of capacitors, in particular to a test fixture for single-layer capacitors. Background technique [0002] The upper and lower sides of the single-layer capacitor are planar gold electrodes. After the single-layer capacitor is manufactured, follow-up tests such as parameter testing, high-temperature aging, and post-aging parameter testing are required, and it is required that no pressure point traces be left on the surface of the two gold electrodes during the aging test. [0003] In addition, the size of the chip capacitor is small, and it is time-consuming and laborious to test a single single-layer capacitor alone. The relative efficiency is relatively low, and it is not suitable for mass production and the improvement of production efficiency. Therefore, it is necessary to minimize manual direct operations in mass production testing. The current production Different fixtures are used for the middle test,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04
Inventor 高敬一孟浩周凯咨
Owner 江苏伊施德创新科技有限公司
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