Test-launch-control remote monitoring platform based on virtualization technology
A virtualization technology and monitoring platform technology, which is applied in the field of long-distance measurement, launch, control and monitoring platform systems for launch vehicles on the ground, can solve the adverse effects of design work, personnel training and cost control, and cannot provide remote data browsing and interpretation services. The terminal hardware performance requirements are relatively high and other problems, so as to reduce the configuration of the corresponding network card, improve the ability to deal with hard disk failures, and improve the transmission reliability.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] Specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0031] The present invention provides a virtualization technology-based measurement, launch, control and monitoring platform, which is used in the long-distance launch process of a certain type of launch vehicle. Through server virtualization construction and disk array redundancy rationalization design, the overall network can be monitored. The data of each subsystem is calculated and stored more efficiently and reliably. Such as figure 1 Shown is the platform system composition of the present invention, from figure 1 It can be seen that a virtualization technology-based measurement, launch, control and monitoring platform provided by the present invention includes: a front-end data acquisition terminal module, a switching network module, a remote monitoring module, a virtualization server module, and a storage module;
[0032] The ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com