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Emissivity measurement method

A measurement method and emissivity technology, applied in the field of radiation temperature measurement, can solve problems such as the inability to meet the accuracy requirements of object emissivity measurement

Inactive Publication Date: 2015-10-28
XI'AN POLYTECHNIC UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a method for measuring emissivity, which can control the accuracy of the measured emissivity within the required accuracy, and solve the problem that the existing emissivity measurement method cannot meet the measurement accuracy requirements for emissivity of objects The problem

Method used

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Embodiment

[0093] The emissivity of three circuit elements A, B and C on a test circuit board is measured by using the optimized emissivity measurement model of the present invention.

[0094] The object of the same material as the circuit element is selected as the experimental object, and the InSb infrared detector (3-5 μm) is used as the measurement device to optimize the emissivity measurement model. Set the target accuracy e=0.01 of the emissivity measurement model, set the temperature T'' obj =45℃, ambient temperature T sur = 23.4°C. The emissivity measurement model is optimized using the optimization method of the present invention, and the optimized parameters and the emissivity measurement values ​​of the three components of the printed circuit board calculated by the optimized emissivity measurement model are shown in Table 1.

[0095] Table 1 Optimization parameters and emissivity measurements of circuit components A, B and C

[0096]

[0097] It can be seen from Table 1...

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Abstract

The invention discloses an emissivity measurement method. The method comprises the processes of establishing an optimized emissivity measurement model, and measuring the emissivity of an object to be measured through using the optimized emissivity measurement model. The optimized emissivity measurement model establishing process concretely comprises the following steps: establishing an initial emissivity measurement model, selecting an object having a same material with the object to be measured as an experiment object, setting an emissivity estimation value epsilon'o, and calculating the set temperature T''obj of the experiment object; putting the experiment object in a blackbody furnace, setting the temperature of the blackbody furnace to be T''obj, and calculating the temperature Tobj of the experiment object in the blackbody furnace and the ambient temperature Tsur outside the blackbody furnace after stable reading; capturing heat radiation itot of the experiment body by using an infrared thermal imager; substituting the itot, the Tobj and the Tsur into the emissivity measurement model, calculating to obtain the emissivity epsilono of the experiment object, comparing the epsilono with the epsilon'o, and ending optimization if the epsilono is greater than the epsilon'o; and resetting the epsilon'o if the epsilono is smaller than the epsilon'o, and re-optimizing until the epsilono is greater than the epsilon'o. The method is simple and fast; and when the optimized emissivity measurement model is used to measure the emissivity of the object, the measurement result is accurate.

Description

technical field [0001] The invention belongs to the technical field of radiation temperature measurement, and in particular relates to a method for measuring emissivity. Background technique [0002] The emissivity (also known as emissivity, blackness coefficient, etc.) of various material surfaces is a physical quantity that characterizes the radiation ability of a material surface, and is an important thermophysical parameter. It is of great significance in many important scientific and technological fields. [0003] Object emissivity is a key parameter for non-contact temperature measurement using infrared radiation. Without accurate object emissivity, it is impossible to obtain true and reliable measurement results with infrared thermal imaging cameras. The emissivity of an object is difficult to obtain experimentally in advance. According to Stephen-Boltzmann's law: any object with a temperature above absolute zero will emit infrared radiation to the surrounding space...

Claims

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Application Information

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IPC IPC(8): G01N25/20
Inventor 李云红张恒马蓉贾利娜
Owner XI'AN POLYTECHNIC UNIVERSITY
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