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Vibration and impact test method of server chassis internal and external parameters and vibration and impact test device of server chassis internal and external parameters

A technology of impact testing and internal and external parameters, which is applied in vibration testing, impact testing, and testing of machine/structural components, etc. It can solve problems such as lack of data basis for fault analysis, little understanding of internal conditions, and inability to collect the acceleration status of electronic components, etc. , to achieve the effect of easy operation

Inactive Publication Date: 2015-11-11
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Vibration and shock testing belongs to the category of reliability testing. Traditional vibration and shock testing is to verify the functionality of the product after the test is completed, such as checking the integrity of each device and whether it can work normally. Acceleration silicon is pasted on several positions of the chassis to measure the acceleration of the corresponding positions of the chassis, and the acceleration state of the electronic components during the test process cannot be collected. Little is known about the internal conditions during the vibration and impact process, and there is insufficient data basis for failure analysis.

Method used

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  • Vibration and impact test method of server chassis internal and external parameters and vibration and impact test device of server chassis internal and external parameters
  • Vibration and impact test method of server chassis internal and external parameters and vibration and impact test device of server chassis internal and external parameters

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Effect test

Embodiment 1

[0027] A vibration and shock test method for internal and external parameters of a server case. During the server vibration and shock test, an equivalent counterweight with a built-in acceleration sensor is used in the server case to replace the real hard disk, power supply and extended graphics card, and the data is collected by the built-in acceleration sensor. Linear force and torque to the real hard disk, power supply and expansion graphics card;

[0028] Paste the acceleration sensor on the outer surface of the chassis, and measure the linear acceleration of the pasting point;

[0029] Use the acceleration sensor inside and outside the chassis to quantitatively describe the status of each part during the server vibration and shock test.

Embodiment 2

[0031] On the basis of Embodiment 1, the equivalent counterweight described in this embodiment has four built-in three-axis acceleration sensors, which are respectively located at the four vertices of the regular tetrahedron, and are used to measure the vibration and impact of the replaced electronic components. For linear acceleration, the difference between the values ​​measured by the four sensors in the same direction can reflect the torsion of the component.

Embodiment 3

[0033] On the basis of embodiment 1 or 2, the specific steps of this implementation described test method are as follows:

[0034] 1) Clarify the test objectives: According to the test requirements, determine the types and quantities of quantitative parameters required inside and outside the server, and prepare the corresponding number of equivalent counterweights and acceleration sensors;

[0035] 2) Build the test equipment: Place the required equivalent counterweight inside the server, the data transmission line needs to pass through the front and rear panels, paste the acceleration sensor on the required position on the outer surface of the server chassis, connect all the data lines to the corresponding adapter and then connect to the collection device;

[0036] 3) Test data reading: Turn on the data acquisition device, perform vibration and impact tests on the server, and control the collection of data through computer software;

[0037] 4) Data analysis: Through the ana...

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Abstract

The present invention discloses a vibration and impact test method of server chassis internal and external parameters and a vibration and impact test device of the server chassis internal and external parameters. The vibration and impact test method of the server chassis internal and external parameters is characterized in that during a server vibration and impact test process, the equivalent counter weight blocks in which the acceleration sensors are arranged are arranged inside a server chassis to substitute for a real hard disk, a power supply and an expansion video card, and the built-in acceleration sensors acquire the linear stress and torsion situations of the real hard disk, the power supply and the expansion video card; the acceleration sensors are pasted on the external surface of the chassis to measure the linear acceleration of the pasting points; and the numerical values of the acceleration sensors inside and outside the chassis are utilized to quantize and describe the states of parts during the server vibration and impact test process. The method and device of the present invention help the anti-vibration and anti-impact structure design of the server chassis a lot, provide more determination bases for the reliability test result analysis, and have the characteristics of being test informatization, being high in flexibility, and being easy to operate.

Description

technical field [0001] The invention relates to the technical field of server chassis testing, in particular to a vibration and shock testing method and device for internal and external parameters of a server chassis. Background technique [0002] Vibration and shock testing belongs to the category of reliability testing. Traditional vibration and shock testing is to verify the functionality of the product after the test is completed, such as checking the integrity of each device and whether it can work normally. Acceleration silicon is pasted on several positions of the chassis to measure the acceleration of the corresponding positions of the chassis, and the acceleration state of the electronic components during the test process cannot be collected. Little is known about the internal conditions during the vibration and shock process, and there is insufficient data basis for failure analysis. Contents of the invention [0003] The technical problem to be solved by the pre...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M7/02G01M7/08
Inventor 龚宝龙
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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