Single measurement node simulation circuit fault diagnosis method

Abstract

The invention discloses a single measurement node simulation circuit fault diagnosis method, comprising steps of obtaining prior sample data vectors under various fault modes, (2) calculating statistic average values of the prior samples under various fault modes, (3) decomposing the signal haar orthogonal wavelet filter set, extracting characteristic factors of the prior sample fault modes, (5) extracting characteristic factors of the fault mode to be detected, (6) calculating a correlation coefficient matrix and correlation degree measurement parameters between the characteristics factors of the fault mode to be detected and the characteristic factors of the prior sample fault modes, and (7) comparing the correlation degree measurement parameters and determining the fault mode according to the maximal correlation principle. The single measurement node simulation circuit fault diagnosis method disclosed by the invention converts single-path signals to multi-path signals under the condition that the original measurement information is not lost, extracts independent characteristic factors of the faulted mode, enables the characteristic factors of the faulted mode to reflect the changing situation of the circuit structure under various fault modes, studies correlated mode determination rule and finishes the successful classification of the circuit fault mode.

Description

Technical field [0001] The invention relates to a fault diagnosis method for a single measurement node analog circuit. Background technique [0002] The analog circuit fault diagnosis is essentially equivalent to the pattern recognition problem, and the key lies in the search for the relationship between feature extraction and pattern criterion function. Therefore, how to find the potential fault characteristic factors from the seemingly complicated measurement data, and based on this, to correctly judge and identify the fault mode, is called an important research topic in the field of analog circuit testing. [0003] After decades of development in analog circuit fault diagnosis, the existing achievements in this area are diverse, and new research results continue to emerge. Summarizing the various technologies used in the fault diagnosis process, the more widely used methods are based on statistical theory, wavelet analysis and fault feature extraction methods, and fault pattern...

AI Technical Summary

Problems solved by technology

Therefore, the circuit with a single measurement node cannot directly apply the blind source separation technology to extract the characteristic factor

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