Inverted LED chip test equipment and test method thereof
A technology for testing LED chips and chips, applied in the field of light sources, can solve the problems of optical test results error of flip-chip LED chips, affecting the test effect of flip-chip LED chips, etc., so as to save production cost and time, reduce workload, and accurately test results. Effect
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[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0051] An embodiment of the present invention provides a testing device for a flip-chip LED chip, which is used for testing the electrical and optical properties of the flip-chip LED chip.
[0052] The flip-chip LED chip in this embodiment is the same as the existing flip-chip LED chip, such as including a positive electrode, a P-type gallium nitride layer, an active layer, an N-type gallium nitride layer, a negative electrode and a transparent substrate, etc. ...
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