A Functional Testing Method of Standard Unit Library with Contrast Function

Abstract

The invention relates to a function testing method of a standard unit library with a self-contained comparison function. The input vector selection expansion module is used to receive or generate an initial vector, and select and expand the initial vector; the standard unit module classifies and stores all unit; compare the unit module, classify and store all ideal models of standard units; address selection module, used to generate test addresses, and play a role in controlling other modules; output vector selection modules 1 and 2, respectively used to receive standard units and ideal units Model output results; comparison and judgment module, used to compare ideal and actual output results. The invention utilizes vector multiplexing to test a plurality of standard units in parallel, reduces redundant vectors, and improves testing speed. While testing the functions of the standard units, the ideal model is used to directly compare the test results to judge whether each unit meets the requirements, which reduces the workload of the testers.

Description

technical field [0001] The invention relates to a function test method of a digital integrated circuit, which belongs to the field of digital integrated circuit verification, and in particular to a function test method of a standard unit library with a self-contained comparison function. Background technique [0002] With the rapid development of integrated circuit design and manufacturing, a single chip can integrate tens of millions of transistors. However, in order to meet more functional requirements, the integration level still needs to be continuously improved. Then, under the premise of ensuring that the chip area remains unchanged, the area of ​​each device unit must be continuously reduced, that is, the minimum size of each gate-level unit is continuously reduced. Every time the size is changed, a new standard cell library is bound to be generated. [0003] Standard cell libraries generally include two types of cells: combinational cells and sequential cells. Com...

AI Technical Summary

Problems solved by technology

Therefore, although this test method is simple and feasible, there are too many redundant vectors, the test efficiency is low, and the standard unit function cannot be automatically detected.

Images