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Novel X-ray micro-imaging system

A microscopic imaging and X-ray technology, which is applied in the field of X-ray microscopic imaging, can solve the problems of high spatial resolution, high energy resolution, and low energy resolution, and achieve high spatial resolution and high energy resolution. Effect

Inactive Publication Date: 2016-01-06
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

The KB microscopic imaging system uses two coated mirrors placed orthogonally to obtain X-ray images by grazing incidence reflection imaging. The KB microscopic imaging system is characterized by high spatial resolution and free choice of working energy points, but the energy resolution low rate
The spherical curved crystal imaging system uses a crystal whose crystal surface is bent into a spherical surface to perform diffraction imaging on the object point under the condition of close to normal incidence. The spherical curved crystal imaging system is characterized by high spatial resolution and high energy resolution, but the working performance Points cannot be selected arbitrarily
[0004] Therefore, neither the existing KB microscopic imaging system nor the spherical curved crystal imaging system can simultaneously achieve high energy resolution, high spatial resolution, and X-ray imaging of any energy point, and thus cannot meet the requirements of many diagnostic experiments.

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Embodiment Construction

[0024] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0025] Please refer to figure 1 and figure 2 , figure 1 A schematic diagram of the optical path arrangement of a novel X-ray microscopic imaging system provided by an embodiment of the present invention, specifically a side view, figure 2 for figure 1 top view. The novel X-ray microscopic imaging system includes:

[0026] The fi...

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Abstract

The invention discloses a novel X ray micro-imaging system which comprises a first optical element and a second optical element, which are arranged in the optical path direction in sequence, wherein the first optical element and the second optical element have curved surfaces; the normal direction of the first optical element and the normal direction of the second optical element are orthogonal; X rays emitted by object points are reflected through the first optical element and the second optical element in sequence to respectively realize focusing and monochromatization in the meridian direction and sagittal direction so as to form a monochromized two-dimensional X ray image; one of the first optical element and the second optical element is a bent crystal; the other optical element is a multilayer-film reflector. According to the micro-imaging system disclosed by the invention, the energy resolution can be increased by adopting the bent crystal, and aberration in the focusing direction is reduced; by using focal length matching of the bent crystal and the multilayer-film reflector, free selection of working energy points is realized. Therefore, the micro-imaging system has the advantages of high energy resolution, high spatial resolution and free selection of working energy points and the defects in the prior art are overcome.

Description

technical field [0001] The invention relates to the technical field of X-ray microscopic imaging, in particular to a novel X-ray microscopic imaging system. Background technique [0002] Inertial confinement fusion (ICF) research is one of the major scientific frontier topics. In the ICF diagnostic experiment, high-resolution imaging of the implosion compression region can obtain the symmetry, uniformity and internal Important physical information such as the hydrodynamic instability of detonation compressed plasma. [0003] At present, X-ray imaging is an important means of imaging the implosion compression region, among which the X-ray Kirkpatrick-Baez (KB) imaging system and spherical curved crystal imaging system are the main equipment for X-ray imaging diagnosis in ICF experiments. The KB microscopic imaging system uses two coated mirrors placed orthogonally to obtain X-ray images by grazing incidence reflection imaging. The KB microscopic imaging system is characteriz...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/00
Inventor 安宁王秋平曹柱荣申锦杜学维
Owner UNIV OF SCI & TECH OF CHINA
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