Metal layer-insulator layer-metal layer capacitor and manufacturing method thereof
A manufacturing method and metal layer technology, applied in the direction of electrical solid-state devices, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as the inability to meet the needs of large-capacity integrated circuits, achieve large capacitance values, and increase capacitance density.
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Embodiment 1
[0039] Figure 1-Figure 10 It is a process schematic diagram of the manufacturing method of the metal layer-insulation layer-metal layer capacitor according to Embodiment 1 of the present invention.
[0040] see figure 1 , providing a first metal layer 100, defining a non-capacitive area and a capacitive area on the first metal layer 100, figure 1 Only the structure of the capacitive region is shown here, and the structure of the non-capacitive region is not shown.
[0041] In the capacitor area, the first dielectric layer 400 , the third barrier layer 500 , and the second dielectric layer 600 are sequentially formed on the surface of the first metal layer 100 . Wherein, the thickness T1T1 of the first dielectric layer 400 is 50 nm-5 μm, and the thickness T2 of the second dielectric layer 600 is 50 nm-5 μm.
[0042] In addition, the adhesion layer 200 and the second barrier layer 300 are preferably sequentially formed on the first metal layer 100 before the step of formin...
Embodiment 2
[0069] Figure 11-Figure 20 It is a process schematic diagram of the manufacturing method of the metal layer-insulation layer-metal layer capacitor according to Embodiment 2 of the present invention.
[0070] see Figure 11 , providing a first metal layer 2100, defining a non-capacitive area and a capacitive area on the first metal layer 2100, Figure 11 Only the structure of the capacitive region is shown here, and the structure of the non-capacitive region is not shown.
[0071] In the capacitor area, a first dielectric layer 2400 is formed on the surface of the first metal layer 2100 . Wherein, the total thickness of the first dielectric layer 2400 is T0. In addition, preferably before the step of forming the first dielectric layer 2400 , the adhesion layer 2200 and the second barrier layer 2300 are sequentially formed on the first metal layer 2100 . Wherein, the adhesion layer 2200 is usually a TiN layer, and the second barrier layer 2300 can be any one or a combinatio...
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