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Automatic test system and method

An automatic test system and automatic test technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of heavy workload, low manual operation efficiency, error-prone, etc. The effect of improving the factory pass rate

Inactive Publication Date: 2016-02-10
SKY LIGHT ELECTRONICS SHENZHEN
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  • Abstract
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  • Application Information

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Problems solved by technology

[0003] The present invention aims to solve the technical problems of low manual operation efficiency, heavy workload and error-prone technical problems in the testing of existing equipment to be tested, and provides an automatic testing system and method that can improve testing efficiency and accuracy

Method used

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Embodiment Construction

[0019] In order to illustrate the idea and purpose of the present invention, the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0020] Such as figure 1 Shown is a schematic structural diagram of an automatic test system in a preferred embodiment of the present invention, and the automatic test system includes: a communication module 10, which is used to connect with the device under test to perform data communication with the device under test, mainly including a serial port communication module and / or Or WIFI wireless communication module and / or Ethernet communication module. The function module 20 is used to define the test items of the device under test and the corresponding test process. Specifically, the test items are defined according to the functions of the device under test, and the test process is defined according to the business element flow of the test item. The device under test can be ...

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Abstract

The invention provides an automatic test system. The automatic test system comprises a communication module which is connected with a device to be tested so as to perform data communication with the device to be tested, a function module used for defining test items of the device to be tested and test processes corresponding to the test items, a loading module used for loading the test items to be tested of the device to be tested as current test items, a display module used for displaying test data and test results, and a processing module used for calling the information of the test items loaded by the loading module to execute test processes corresponding to the test items; and the communication module is in data communication with the device to be tested, so that a test be completed, and then, the test data are transmitted to the display module to be displayed. The invention also provides an automatic test method. According to the automatic test system and method of the invention, modular design is adopted, and therefore, test functions can be increased in follow-up stages, and therefore, scalability is high, test efficiency can be improved, and the quality of outgoing products can be improved.

Description

technical field [0001] The invention relates to the technical field of automatic testing, in particular to an automatic testing system and method. Background technique [0002] With the development of science and technology, electronic products and monitoring equipment have developed rapidly. Each product has to undergo strict unit testing and functional testing before leaving the factory. Now most of the products are tested manually, and data entry and statistics are extremely inconvenient. Moreover, the efficiency is low, the workload is large, and it is easy to make mistakes. Contents of the invention [0003] The invention aims to solve the technical problems of low manual operation efficiency, heavy workload and error-prone when the existing equipment to be tested is used for testing, and provides an automatic testing system and method capable of improving testing efficiency and accuracy. [0004] In order to solve the above technical problems, the present invention ...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 郭晓军杨祥华
Owner SKY LIGHT ELECTRONICS SHENZHEN
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