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A New Optical Arm Amplified 3D Linear Measuring Head
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A three-dimensional linear and probe technology, applied in the field of precision measurement, can solve the problems of low precision, high cost, complex structure, etc., and achieve the effect of improving measurement accuracy, simplifying structure and reducing production cost
Active Publication Date: 2019-02-15
JIANGSU QIHAO PRECISION MACHINERY
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Problems solved by technology
[0005] The purpose of the present invention is to overcome the above disadvantages of low precision of mechanical probe and trigger probe in the prior art, as well as the above-mentioned shortcomings of complex structure and high cost of scanning probe, and provide a simple structure and high measurement accuracy. Gao’s new optical arm enlarged three-dimensional scanning probe can measure the displacement of the probe in three directions, and can compensate the measured workpiece caused by the displacement of the measuring ball when the measuring ball touches the workpiece through displacement superposition. Position measurement deviation, to obtain more accurate measurement coordinates of the measured workpiece
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Embodiment 1
[0054] Such as figure 1 , 2 As shown, a new type of optical arm magnified 3D scanning probe, including:
[0055] Three laser sources, namely laser source one 11, laser source two 12 and laser source three 13, respectively generate three laser beams, namely laser beam one 21, laser beam two 22 and laser beam three 23;
[0056] The probe base 4 includes at least three reflective surfaces, wherein three reflective surfaces, i.e. reflective surface one 41, reflective surface two 42, and reflective surface three 43 are arranged perpendicular to each other in pairs, and the three reflective surfaces are respectively used to reflect the three The above-mentioned laser beam, the probe base 4 is provided with a measuring rod 6 and a measuring ball 7 for detection;
[0057] Three photodetectors, i.e. photodetector 1 31, photodetector 2 32 and photodetector 3 33, are respectively used to receive the reflective surface 1 41, reflective surface 2 42 and reflective surface 3 on the probe ...
Embodiment 2
[0074] A new type of optical arm enlarged three-dimensional scanning measuring head, like embodiment 1, includes:
[0075] Such as Figure 1-6 As shown, three laser sources, namely laser source one 11, laser source two 12 and laser source three 13, respectively generate three laser beams, namely laser beam one 21, laser beam two 22 and laser beam three 23;
[0076] The probe base 4 includes at least three reflective surfaces, wherein three reflective surfaces, i.e. reflective surface one 41, reflective surface two 42, and reflective surface three 43 are arranged perpendicular to each other in pairs, and the three reflective surfaces are respectively used to reflect the three The above-mentioned laser beam, the probe base 4 is provided with a measuring rod 6 and a measuring ball 7 for detection;
[0077] Three photodetectors, i.e. photodetector 1 31, photodetector 2 32 and photodetector 3 33, are respectively used to receive the reflective surface 1 41, reflective surface 2 42...
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Abstract
The invention discloses a novel optical arm amplification-type three-dimensional linear measuring head which comprises three laser beams; a measuring head base comprising three reflection surfaces and a measuring bar and a measuring ball for detection; three photoelectric detectors, which are used for receiving the three laser beams reflected by the measuring head base respectively; a translation portion for enabling the measuring head base to be in rectilinear motion; a return portion for enabling the measuring head base to be returned to the initial position; and a processingsystem for carrying out calculating to obtain a three-dimensional displacement change value of the measuring ball. The novel optical arm amplification-type three-dimensional linear measuring head can obtain measuring head displacement amount in three different rectilinear directions through the three photoelectric detectors, and furthermore, can obtain more accurate measuring coordinate of a tested workpiece, thereby improving the measurement accuracy of the three-dimensional linear measuring head, simplifying the structure, reducing production cost, and being easy for batch processing and manufacturing.
Description
technical field [0001] The invention relates to the technical field of precision measurement, in particular to a novel optical arm enlarged three-dimensional scanning measuring head. Background technique [0002] The probe is one of the key components of the precision measuring instrument. As a sensor, it provides the geometric position information of the workpiece to be measured. The development level of the probe directly affects the measurement accuracy and efficiency of the precision measuring instrument. Precision probes are usually divided into contact probes and non-contact probes, of which contact probes are divided into mechanical probes, trigger probes and scanning probes; non-contact probes are divided into laser probes probes and optical video probes. [0003] The mechanical probe is an earlier type of probe used in precision measuring instruments. The probe is used for position measurement through direct contact between the probe end and the workpiece to be me...
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