High-temperature-box-used LED device burn-in device meeting LM80 requirements

Abstract

The invention discloses a high-temperature-box-used LED device burn-in device meeting the LM80 requirements, and relates to the technical field of electrical property test devices. The device comprises a framework type base body, a sample support plate, a heat sink and a top cover. The heat sink is fixed at the lower surface of the framework type base body so that a container-shaped structure of which the upper end is open is formed by the heat sink and the framework type base body. The external side surface of the base body is provided with power supply and thermocouple through holes. The sample support plate is arranged in the base body. The top cover is arranged at the opening of the container-shaped structure. The top cover is provided with multiple fixing hole positions. The base body, the heat sink and the top cover are fixedly connected together via bolts. The burn-in device has the characteristics of being convenient to use and low in cost so that temperature uniformity and stability can be guaranteed.

Description

technical field [0001] The invention relates to the technical field of testing devices for electrical properties, in particular to an aging device for LED devices in a high-temperature box that meets the requirements of LM80. Background technique [0002] The LM806000h burn-in data of LED devices is currently a highly recognized performance index in the industry, but the LM80 test method requires minimal airflow disturbance during device burn-in, and the relevant test equipment on the market is mainly divided into two categories: one is The use of semiconductor refrigeration is expensive. One is to reduce the air circulation wind speed to below 0.5m / s, resulting in a decrease in temperature control capability and a smaller box volume. It is also a special-purpose equipment with poor versatility, which increases equipment procurement costs. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide an aging device for LED de...

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Problems solved by technology

[0002] The LM806000h burn-in data of LED devices is currently a highly recognized performance index in the industry, but the LM80 test method requires minimal airflow disturbance during device burn-in, and the relevant test equipment on the market is mainly divided into two categories: one is The use of semiconductor refrigeration is expensive. One is to reduce the air circulation wind speed to below 0.5m / s, resulting in a decrease in temperature control capability and a smaller box volume. It is also a special-purpose equipment with poor versatility, which increases equipment procurement costs.

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