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Programmer test device and test method

A technology of testing devices and programmers, which is applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve the problems that the production cost and speed of manpower testing cannot meet the actual needs, and achieve the effect of reducing costs and improving detection efficiency

Active Publication Date: 2016-04-20
HANGZHOU SILAN MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the rapid development of today's technological level, along with the higher and higher labor costs, programmable circuits are popularized and applied by more and more customers, and the actual demand for programming tools is increasing. In the past, the cost and speed of human testing and production Can no longer meet the actual needs

Method used

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  • Programmer test device and test method
  • Programmer test device and test method

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Embodiment Construction

[0026] Various embodiments of the invention will be described in more detail below with reference to the accompanying drawings. In the various drawings, the same elements are denoted by the same or similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale.

[0027] The invention can be embodied in various forms, some examples of which are described below.

[0028] figure 1 A schematic structural diagram of a programmer testing device according to an embodiment of the present invention is shown. Such as figure 1 As shown, the programmer testing device 100 of this embodiment includes a main processor 101 , a test card module 102 , a signal source module 103 , a serial communication module 104 and a fixture 105 .

[0029] Wherein, the main processor 101 is connected with the test card module 102 , the signal source module 103 and the serial port communication module 104 .

[0030] The test card module 102 is used for coll...

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Abstract

Disclosed is a programmer test device comprising a fixture used for fixing a programmer to be tested, a test card module used for collecting test data of the programmer to be tested, a serial communication module used for sending a file signal flow to the programmer to be tested, and a main processor connected with a signal source module, the serial communication module and the test card module and used for acquiring the test data of the programmer to be tested through the test card module. The invention further provides a programmer test method. A detection instruction is executed independently, or multiple detection instructions are executed in sequence. The detection efficiency is improved, and the cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit programming, and more specifically relates to a test device and method for mass production of programmers. Background technique [0002] With the rapid development of today's technological level, along with the higher and higher labor costs, programmable circuits are popularized and applied by more and more customers, and the actual demand for programming tools is increasing. In the past, the cost and speed of human testing and production It has been unable to meet the actual needs. Therefore, we have developed a production test device, which is specially used in mass production as an auxiliary test programming tool. Contents of the invention [0003] The object of the present invention is to provide a test device and test method for mass production of programmers. [0004] According to one aspect of the present invention, a programmer testing device is provided, including: a fixtur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 王希清潘子升魏建中
Owner HANGZHOU SILAN MICROELECTRONICS
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