A Microwave Test Coupling Clutter Elimination Method Based on Image Entropy

Abstract

The invention discloses an image entropy-based microwave test coupling clutter elimination method. The method comprises the steps of in the non-darkroom condition, obtaining multiple swept-frequency and swept-angle scattering signals of a to-be-measured object; conducting the initial de-coupling treatment on the obtained multiple swept-frequency and swept-angle scattering signals respectively; conducting the inverse-synthetic-aperture imaging treatment on the above signals to obtain the corresponding multiple scattering image information; finally, with the image entropy of the scattering image information of the to-be-measured object in the initial state to be minimized as an objective function, optimizing the intensity of the scattering points of the to-be-measured object based on the optimization algorithm to obtain optimal parameters. In this way, the inverse-synthetic-aperture image of the to-be-measured object in the initial state with the image entropy thereof to be minimized is obtained. According to the technical scheme of the invention, an operator no longer needs to know the electromagnetic wave propagation path in advance. Meanwhile, through processing a complex structure, coupling signals and the signal of to-be-measured equipment itself, with the transmission paths thereof overlapped, can be distinguished. Moreover, the above method can be combined with other clutter elimination methods.

Description

technical field [0001] The invention relates to the technical field of microwave testing, in particular to a microwave testing coupling clutter elimination method based on image entropy. Background technique [0002] In microwave testing, the environment of the device under test (including brackets, ground, and test equipment near the device under test) and external radio frequency interference will have a significant impact on the test results. Therefore, microwave anechoic chambers are often used in microwave measurement to achieve the effect of shielding external radio frequency interference and weakening the coupling between the environment and the equipment under test. However, microwave anechoic chambers, especially large microwave anechoic chambers, are expensive to manufacture, and the testing cost is very high. In some cases, if the equipment to be tested is too large and there is no dark room that can accommodate the equipment to be tested, it is necessary to test...

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Problems solved by technology

[0004] It can be found that the above three methods all rely on the different propagation paths of the scattered signal and the coupled signal of the device under test, and the resulting separability in the time domain. For larger devices or complex propagation paths Although the transmission paths of the coupling signal and the scattering signal of the equipment under test are different in the equipment under test, their lengths may overlap with the corresponding propagation time. The above method cannot effectively eliminate the coupling clutter

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