The invention relates to the field of
remote sensing, The inventionand provides a wheat
crop leaf area index inversion method based on
microwave scattering and
canopy simulation. The method comprisesthe steps that of S1, S1, the, based on actually measured
crop and soil data, simulating
microwave scattering conditions of wheat crops in each key growth period and soil in a research area through awheat
crop growth period-based
microwave scattering model, calculating a crop
microwave scattering ratio according to the
microwave scattering conditions, and performing spatial interpolation on the
microwave scattering ratio to obtain a space crop microwave scattering ratio; S; s2, preprocessing the
radar image of each key growth period of the wheat crops; o; obtaining HV and HH polarization backward scattering coefficients, inverting the wheat crop LAI pixel by pixel by using the wheat crop LAI inversion model based on
canopy simulation based on the space crop microwave scattering ratio, andperforming
mask by using the wheat crop distribution map to obtain a regional wheat crop LAI inversion result. According to the method, the regional wheat crop LAI inversion precision and efficiencyare improved, and a new technical means is provided for rapid, large-area, real-time and dynamic
crop growth vigor and yield monitoring.