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138results about How to "Reduce reflective effect" patented technology

Method for making fog face release paper

The invention relates to a method for making fog face release paper, which mainly comprises the following steps of: a first step of laminating a laminated layer on one lateral surface of body paper of the release paper by a laminating machine and cooling; a second step of coating a layer of fog face release agent on the laminated layer; and a third step of drying the fog face release agent. A rawmaterial formula of the fog face release agent comprises 25 to 35 percent of hydroxyl silicone oil, 0.5 to 4 percent of curing agent, 2 to 8 percent of catalyst, 15 to 55 percent of polyurethane adhesive, 0.3 to 5 percent of fumed silica and 10 to 50 percent of filler, wherein the curing agent is methyl hydrogen silicone fluid; the catalyst is platinum; and the filler is talcum powder of which the practical diameter is less than or equal to 15 microns. The method disclosed by the invention has simple production process and is convenient to operate. The cost is reduced. The concave-convex surface of laminated paper is filled and leveled up by the release agent mixed with a fog agent. The fog face release paper which has stable stripping strength and ensures the adhesive surface of a pressure sensing adhesive to have a good haze effect can be produced, so that the adhesive surface has a low-reflection effect.
Owner:太仓斯迪克新材料科技有限公司

Input/output structure of broadband phase shift travelling wave tube

The invention, which belongs to the vacuum electronic technology field, relates to an input / output structure of a broadband phase shift travelling wave tube. The structure comprises six parts of waveguide type elements: a first double-ridge loading rectangular wave guide; a double-ridge loading rectangular wave guide, which is in a bending state of 90 degrees; a second double-ridge loading rectangular wave guide; a double-ridge gradient double-ridge loading rectangular wave guide; a first rectangular wave guide and a second rectangular wave guide. The first double-ridge loading rectangular wave guide and the second double-ridge loading rectangular wave guide are respectively connected with two ends of the double-ridge loading rectangular wave guide that is in a 90 degree bending; the double-ridge gradient double-ridge loading rectangular wave guide is connected between the second double-ridge loading rectangular wave guide and the first rectangular wave guide; and the second rectangular wave guide is connected with an outboard curved surface window of the double-ridge loading rectangular wave guide that is in a 90 degree bending, wherein a central axis of the double-ridge loading rectangular wave guide that is in a 90 degree bending is superposed with a central axis of the first rectangular wave guide. According to the invention, broadband microwave signal energy and a band shape electronic beam can be well introduced and a sine wave guide structure can be lead out; besides, the input / output structure is simple and is easy to process and realize.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Antenna field calibration system and method

The embodiment of the invention discloses an antenna field calibration system and method, and the system comprises a to-be-tested antenna which is erected in a manner of being vertical to the ground and is used for transmitting electromagnetic waves which are transmitted upwards in the direction vertical to the ground; a scanning probe which is erected on a mechanical arm, directly faces and is coaxially erected with the to-be-tested antenna under the horizontal polarization condition at the same time, and is used for scanning electromagnetic waves emitted by the to-be-tested antenna; a control computer which is used for adjusting the mechanical arm, so that the probe opening surface of the scanning probe is parallel to the opening surface of the to-be-detected antenna at a position with a certain distance right above the to-be-detected antenna, and controlling the mechanical arm to enable the scanning probe to sequentially collect the amplitude and phase of each to-be-measured frequency point in the space at a preset stepping value according to the transverse axis of the mechanical arm in a preset scanning plane; and a vector network analyzer which is used for receiving acquired data of the scanning probe, measuring amplitude and phase values of the to-be-measured frequency points on a scanning plane, and recording the measured values and corresponding position coordinates; wherein the control computer converts the measured values and the corresponding position coordinate into a far-field pattern of the to-be-tested antenna.
Owner:BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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