The invention discloses a wWheat crop leaf area index inversion method based on microwave scattering and canopy simulation

A technology of microwave scattering and backscattering coefficient, applied in the field of remote sensing, can solve the problem of unreasonable description of microwave scattering mechanism, and achieve the effect of improving inversion accuracy and efficiency

Pending Publication Date: 2019-04-12
INST OF AGRI RESOURCES & REGIONAL PLANNING CHINESE ACADEMY OF AGRI SCI
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Problems solved by technology

[0006] Based on the research status in the background technology, the present invention aims at the unreasonable description of the microwave scattering mechanism of wheat crops in different growth stages by the existing microwave scattering model, as well as the actual growth conditions and geometric characteristics of wheat crops in my country, and proposes a method for wheat The microwave scattering model of wheat crops in different growth stages is used, and the influence of soil underlying surface on the backscattering of wheat crops in different growth stages is eliminated by the proposed model to obtain the backscatter coefficient of wheat crops

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  • The invention discloses a wWheat crop leaf area index inversion method based on microwave scattering and canopy simulation
  • The invention discloses a wWheat crop leaf area index inversion method based on microwave scattering and canopy simulation
  • The invention discloses a wWheat crop leaf area index inversion method based on microwave scattering and canopy simulation

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[0260] The present invention takes winter wheat as an example to explain how to perform LAI inversion by using the proposed wheat crop LAI inversion method. The research area is located in Shenzhou City, Hengshui, Hebei Province, which belongs to the Huanghuaihai region, an important agricultural production area in China. The area covered by the study area is 25km×25km, and the terrain is relatively flat. This area belongs to the temperate semi-humid continental monsoon climate zone. The main crop planting system is Winter wheat-summer corn is double-cropped a year. The summer crops are mainly winter wheat, and the autumn crops are mainly corn and cotton. Among them, the winter wheat in the research area is sown from early October to early or mid-June of the following year; the overwintering period is from late November to mid-to-late February of the following year, and it enters the greening period from the end of February to early March, when winter wheat begins to flourish....

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Abstract

The invention relates to the field of remote sensing, The inventionand provides a wheat crop leaf area index inversion method based on microwave scattering and canopy simulation. The method comprisesthe steps that of S1, S1, the, based on actually measured crop and soil data, simulating microwave scattering conditions of wheat crops in each key growth period and soil in a research area through awheat crop growth period-based microwave scattering model, calculating a crop microwave scattering ratio according to the microwave scattering conditions, and performing spatial interpolation on the microwave scattering ratio to obtain a space crop microwave scattering ratio; S; s2, preprocessing the radar image of each key growth period of the wheat crops; o; obtaining HV and HH polarization backward scattering coefficients, inverting the wheat crop LAI pixel by pixel by using the wheat crop LAI inversion model based on canopy simulation based on the space crop microwave scattering ratio, andperforming mask by using the wheat crop distribution map to obtain a regional wheat crop LAI inversion result. According to the method, the regional wheat crop LAI inversion precision and efficiencyare improved, and a new technical means is provided for rapid, large-area, real-time and dynamic crop growth vigor and yield monitoring.

Description

technical field [0001] The invention relates to the field of remote sensing, more specifically, to a crop leaf area index inversion method. Background technique [0002] Leaf area index (LAI) is an important parameter to characterize the structure of vegetation canopy and describe the characteristics of vegetation canopy. It has been widely used in the research fields of agriculture, ecology and climate change. At the same time, in the field of agriculture, LAI is also one of the quantitative indicators for crop growth monitoring, and is directly related to crop yield in a specific growth stage of crops. At present, LAI research based on remote sensing is mainly concentrated in the field of optical remote sensing, which has high requirements for the quality of remote sensing images. However, optical remote sensing is easily affected by conditions such as atmosphere, cloud and rain, which has brought adverse effects on remote sensing monitoring and inversion of LAI. With th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q50/02G06F17/12G06F17/15G06F17/16G06F17/18G06F17/50
CPCG06F17/12G06F17/15G06F17/16G06F17/18G06F30/20G06F30/333G06Q50/02
Inventor 吴尚蓉陈仲新杨鹏任建强李贺
Owner INST OF AGRI RESOURCES & REGIONAL PLANNING CHINESE ACADEMY OF AGRI SCI
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