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Microwave scattering property test system based on vector network analyzer

A technology of vector network analysis and characteristic testing, which is applied in the field of radar testing, can solve problems such as poor system stability, difficult maintenance, and rapid device aging, and achieve the effects of stable performance, strong environmental adaptability, and large dynamic range

Active Publication Date: 2012-07-18
THE 22ND RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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Problems solved by technology

Moreover, most scatterometers have problems such as poor system stability, rapid device aging, and difficult maintenance. In terms of system stability and test accuracy, they are also very important to the design of scatterometers.

Method used

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  • Microwave scattering property test system based on vector network analyzer
  • Microwave scattering property test system based on vector network analyzer
  • Microwave scattering property test system based on vector network analyzer

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Embodiment Construction

[0034] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0035] The microwave scattering characteristic test system based on the vector network analyzer of the present invention adopts the narrow-band pulse detection mode of the vector network to realize the effective isolation of transmission and reception under the single antenna mode, and has multiple bands (L, S, C, X, Ku and Ka bands) , Multi-polarization (HH, VV, HV and VH polarization), multi-angle (pitch and azimuth) ground, camouflage net and target scattering characteristic test function.

[0036] Such as figure 1 As shown, the microwave scattering characteristic test system based on the vector network analyzer of the present invention is composed of a transceiver subsystem, a structure s...

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Abstract

The invention discloses a microwave scattering property test system based on a vector network analyzer. The microwave scattering property test system comprises the vector network analyzer, an antenna and a main control computer, wherein the vector network analyzer is used for generating a pulse radio frequency signal of a designated parameter under the control of the main control computer; the pulse radio frequency signal is transmitted by the antenna; and the vector network analyzer is also used for carrying out strobe treatment on a target echo signal received by the antenna to obtain microwave scattering property data within a designated area range. The vector network analyzer can be used for generating a narrowband pulse radio frequency signal with the frequency range covering wavebands of L, S, C, X, Ku and Ka; and the position of a strobe gate of a receiver is set by adopting a mode of fixed point test in pulse according to a test object. The microwave scattering property test system disclosed by the invention is convenient for field work and stable in performance and can be used for scattering property test of the ground background and a large-area camouflage net or the target scattering property test.

Description

technical field [0001] The invention relates to the technical field of radar testing, in particular to a microwave scattering characteristic testing system based on a vector network analyzer. Background technique [0002] In the measurement of the scattering characteristics of ground objects, the scatterometer is generally used. The scatterometer is a radar specially designed for testing the backscatter coefficient. It is a special equipment for testing the scattering characteristics of the surface target. Also available as a scatterometer. [0003] Common signal forms for configuring scatterometers usually include continuous wave, frequency-modulated continuous wave, frequency-stepped continuous wave, pulse signal, etc. The advantage of the continuous wave scatterometer is that the equipment is simple and can test the Doppler effect, but the non-modulated continuous wave scatterometer cannot measure the distance. In order to solve the problem that the continuous wave scat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/40G01R29/08
Inventor 张浙东张玉石李慧明刘斌许心瑜李善斌田霞牟长军尹志盈
Owner THE 22ND RES INST OF CHINA ELECTRONICS TECH GROUP CORP
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