Scattering matrix parameter detection system for microwave sensing

A scattering matrix and parameter detection technology, which is applied in the direction of transmitting sensing components, measuring devices, and measuring electrical variables using wave/particle radiation devices, can solve the problems of large measurement limitations, achieve accurate transmission coefficients, and intuitively understand the measurement results , the effect of strong adaptability

Pending Publication Date: 2020-12-18
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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Problems solved by technology

It's just that the system can only be used for microwave sensors with specific ports, which has the disadvantage of large measurement limitations

Method used

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  • Scattering matrix parameter detection system for microwave sensing
  • Scattering matrix parameter detection system for microwave sensing
  • Scattering matrix parameter detection system for microwave sensing

Examples

Experimental program
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Embodiment Construction

[0022] Such as figure 1 As shown in the simplified block diagram, a scattering matrix parameter detection system for microwave sensing includes a DC scanning parameter module, a microwave circuit module, a processing and display module, and a microwave sensor module.

[0023] Further, as figure 2 As shown in the detailed functional block diagram of the single-port microwave sensor test, the functions of the reference signal generator 11, the first data processing unit 31 and the second data processing unit 32 are realized by the programming of the single-chip microcomputer stm32f103c8t6 and the DAC development board MCP4725, such as Figure 4 The sawtooth-like voltage signal controls the voltage-controlled oscillator 12 to generate a frequency-sweeping microwave signal of 2.8-3.2 GHz; the phase-locked loop 13 plays the role of stabilizing the output of the microwave signal; the first directional coupler 21, the second The directional coupler 22 and the third directional coup...

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Abstract

The invention relates to a scattering matrix parameter detection system for microwave sensing. The system comprises a direct current parameter scanning module (1), a microwave circuit module (2), a processing display module (3) and a microwave sensor module (4) which are mutually combined to realize voltage control frequency parameter scanning, the values of the incident signal and the reflectionsignal or the straight-through signal are compared to obtain the variation trend of the reflection coefficient and the transmission coefficient in the microwave scattering matrix parameter, and the variation trend of the reflection coefficient and the transmission coefficient is calibrated to obtain the microwave scattering matrix parameter detected in real time; according to the invention, the function of displaying the scattering matrix parameter curve fed back by the microwave sensor and the value of the resonance point frequency on the screen in real time is finally realized. The inventionprovides the system capable of testing the scattering matrix parameter of a microwave device in an external complex environment. According to the specific technical mode, scattering matrix parametertesting of the microwave sensor is achieved through matching of single-chip microcomputer programming and a radio frequency circuit module.

Description

technical field [0001] The invention belongs to the field of microwave sensor testing systems, and in particular relates to a system for testing the scattering coefficient of microwave sensors. Background technique [0002] With the rapid development of microwave sensing technology, microwave sensors have the excellent characteristics of high precision, good real-time performance and rich variety, and have been widely used in various detection scenarios. How to detect the data obtained by microwave sensors in real time has become a kind of demand. Although traditional vector network analyzers have very high test accuracy and bandwidth, they are not suitable for testing in most scenarios outside the laboratory due to their bulky size, large dependence on the environment, and very expensive prices. In order to improve the measurement accuracy of the microwave sensing test system and reduce the volume of the test system on this basis, different types of microwave sensing test ...

Claims

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Application Information

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IPC IPC(8): G01D5/48G01R19/10G01R27/26
CPCG01D5/48G01R19/10G01R27/2635G01R27/2688
Inventor 林先其肖峰文章陈哲王承辉闫禹衡曹垒
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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