Sample holder suitable for metal mass analyzer sample
A metal quality analyzer technology, applied in the field of laboratory equipment, can solve the problems of uneven samples, inconsistent sample heights, sample holders that cannot be used for metal quality analyzers, etc., and achieve the effect of sufficient positioning and simple structure
Active Publication Date: 2016-04-27
DAYE SPECIAL STEEL CO LTD
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Problems solved by technology
[0008] The purpose of the present invention is to provide a sample holder suitable for metal quality analyzer samples, to at least solve the technical problem that the sample holder in the prior art cannot be applied to the metal quality analyzer, and solve the sample unevenness in the prior art , The height of the sample is not consistent, which leads to the technical problem that only one sample can be tested at a time
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[0031] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.
[0032] Such as figure 1 , figure 2 and image 3 As shown, the sample holder suitable for metal quality analyzer samples in the preferred embodiment of the present invention mainly includes a base 1, and a horizontal slot 11 is provided on the upper part of the base 1, and the base 1 is used to connect the detection equipment and provide overall support; The position piece 2 is inserted into the horizontal slot 11 of the base 1, and is used to limit the upper position of the sample; and the spring 3 is installed on the base 1, and the sample is placed between the spring 3 and the limit piece 2, and the spring 3 is used to provide elastic support for the sample.
[0033] In a word, the sample rack suitable for metal quality analyzer samples provided by the present invention takes the base 1 as the installation basis, and the stop pl...
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The present invention provides a sample holder suitable for a metal mass analyzer sample, the sample holder includes a base, a restriction piece and a spring, the upper part of the base is provided with a horizontal card slot, the base is used for connecting test equipment and providing an overall support, the restriction piece is inserted into the horizontal card slot of the base, and is used for the upper limitation of the sample, the spring is mounted on the base, the sample is placed between the spring and the restriction piece, and the spring is used for providing an elastic support for the sample. The sample holder utilizes the restriction piece and the spring for the upper limitation and the lower limitation of the sample, elastic jacking force of the spring is fully used, so that an upper testing surface of the sample is closely combined and contacted with the restriction piece, and the sample holder has the characteristics of being simple in structure, and capable of fully locating the sample.
Description
technical field [0001] The invention belongs to the technical field of laboratory equipment. Specifically, the invention relates to a sample holder of a scanning electron microscope sample, in particular to a sample holder suitable for a sample of a metal quality analyzer. Background technique [0002] The metal quality analyzer equipment purchased by the research unit is mainly used to study the statistics and analysis of non-metallic inclusions in steel. Specifically, the polished metallographic sample is scanned by a high-energy electron beam, the backscattered electrons and characteristic X-ray signals are detected, the non-metallic inclusions in steel are judged by the backscattered electron signals, and the non-metallic inclusions are judged by the characteristic X-ray signals Composition, so as to obtain the quantity, size, composition and other information of non-metallic inclusions in steel within a certain area, and then display these data in an intuitive form thro...
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Login to View More IPC IPC(8): G01N23/22
CPCG01N23/2204G01N2223/309G01N2223/624G01N2223/652
Inventor 杨娥杨智
Owner DAYE SPECIAL STEEL CO LTD