High and low temperature test chamber with evaporator overflowing device

Abstract

The invention provides a high and low test chamber with an evaporator overflowing device, the high and low test chamber includes a machine box, a refrigeration device, an air compression device, the evaporator overflowing device, an embedded-style copper pipe and a circulation duct; the machine box includes a work room and a control room; the work room is located above the control room; the inner wall of the work room is also provided with the embedded-style copper pipe; the inner wall of the work room is also provided with the circulation duct and the evaporator overflowing device; the circulation duct forms a circulation path along the inner wall of the work room; the control room is internally provided with the refrigeration device and the air compression device; the refrigeration device is connected with the embedded-style copper pipe; the air compression device is connected with the circulation duct; the evaporator overflowing device includes cooling sheets, an evaporation pipe, a stainless steel frame seal piece and a stainless steel frame; the evaporation pipe is a bending coiled pipe; the upper side of the evaporation pipe is provided with a series of cooling sheets, the cooling sheets are arranged uniformly, and distances between the adjacent cooling sheets are equal; the cooling sheets and the evaporation pipes are mounted inside the stainless steel frame; and the stainless steel frame is connected with the cooling sheets by the stainless steel frame seal piece.

Description

technical field [0001] The invention relates to the field of building material test equipment, in particular to a high and low temperature test box with an evaporator overflow device. Background technique [0002] The low temperature test chamber can be used to assess and determine the adaptability of electrical and electronic products or materials for storage and use under temperature cycle changes and low temperature environmental conditions on the product surface. The equipment uses forced air circulation to maintain the uniformity of temperature in the working room. In order to limit the influence of radiation, the difference between the temperature of each part of the inner wall of the equipment and the temperature specified in the test is not more than 8%, and the test sample will not be directly radiated by the heating and cooling elements in the equipment. In order to ensure the cooling rate and minimum temperature requirements of the test chamber, the refrigeration...

AI Technical Summary

Problems solved by technology

[0003] The technical problem mainly solved by the present invention is to provide a high and low temperature test box with an evaporator overcurrent device, which has a reasonable design and simple structure, and solves the problem of difficult installation of the evaporator on the high and low temperature test box

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