High-low-temperature test chamber with high-temperature-resistant layer

Abstract

The invention relates to a high-low-temperature test chamber with a high-temperature-resistant layer. The high-low-temperature test chamber comprises a case, a refrigeration device, an air compression device, a pre-buried copper pipe and a circulating air duct, wherein the case comprises a working chamber and a control chamber; the working chamber is located above the control chamber; the inner wall of the working chamber is provided with the pre-buried copper pipe and the circulating air duct; the circulating air duct forms a circulating path along the inner wall of the working chamber; the air compression device and the refrigeration device are arranged inside the control chamber; the refrigeration device and the pre-buried copper pipe are in connection; the air compression device and the circulating air duct are in connection; the inner wall of the working chamber is a high-temperature-resistant and heat-insulating layer which comprises a stainless-steel liner layer, a high-temperature-resistant mineral-wool layer, a polyurethane high-temperature-resistant layer and a surface layer; the high-temperature-resistant mineral-wool layer is laminated on one side of the polyurethane high-temperature-resistant layer; the surface layer is laminated on the other side of the polyurethane high-temperature-resistant layer; and the stainless-steel liner layer is laminated on the other side of the high-temperature-resistant mineral-wool layer.

Description

technical field [0001] The invention relates to the field of building material test equipment, in particular to a high and low temperature test box with a high temperature resistant layer. Background technique [0002] The low temperature test chamber can be used to assess and determine the adaptability of electrical and electronic products or materials for storage and use under temperature cycle changes and low temperature environmental conditions on the product surface. The equipment uses forced air circulation to maintain the uniformity of temperature in the working room. In order to limit the influence of radiation, the difference between the temperature of each part of the inner wall of the equipment and the temperature specified in the test is not more than 8%, and the test sample will not be directly radiated by the heating and cooling elements in the equipment. In order to ensure the cooling rate and minimum temperature requirements of the test chamber, the refriger...

AI Technical Summary

Problems solved by technology

However, in terms of the rate of temperature adjustment, it has an obvious lack of capacity. It takes a long time to adjust the temperature to reach the expected structure, so the work efficiency will be low.

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