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A Dictionary Encoding Method for Test Data

A technology of testing data and coding methods, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of compression rate influence and no consideration, and achieve the effect of improving compression rate

Inactive Publication Date: 2018-08-17
INST OF ACOUSTICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Liu Jie et al. considered that the scanned slice to be encoded is compatible with dictionary entries, reverse compatibility, shift compatibility and shift reverse compatibility, etc., but when performing reverse compatibility and shift compatibility, etc. When judging the situation, when the dictionary entry utilizes reverse compatibility (or shift compatibility) to encode multiple scan slices, how to realize the problem of encoding the most scan slices to achieve high compression ratio; and due to compatibility There are many possibilities for the existence of sex, resulting in many prefixes of the encoded codeword, which will have a certain impact on the compression rate

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  • A Dictionary Encoding Method for Test Data
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  • A Dictionary Encoding Method for Test Data

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Embodiment Construction

[0032] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0033] In order to facilitate the understanding of the embodiments of the present invention, further explanations will be given below with specific embodiments in conjunction with the accompanying drawings.

[0034] In order to understand the difference between the present invention and the prior art more clearly, the following figure 1 , ...

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Abstract

The invention relates to a test data dictionary coding method which includes the following steps of: generating dictionary entries; aiming at each dictionary entry, performing reverse compatibility analysis, and determining scanning sections reverse compatible with the dictionary entries; and coding each scanning section according to a set rule. The method of generating the dictionary entries also includes the steps that: an undirected graph G is established by taking each scanning section as a vertex, if any two scanning sections are compatible, an edge is formed between the vertexes corresponding to the scanning sections; m maximum complete subgraphes are obtained through a heuristic algorithm, m being the number of default dictionary entries; and the dictionary entry corresponding to each maximum complete subgraph is generated. When the reverse compatibility analysis is performed on the dictionary entries, the heuristic algorithm is introduced. The maximum complete subgraph of the graph formed by the scanning sections reverse compatible with the dictionary entries is found, the coding rule is combined, and a compression ratio of the test data is improved.

Description

technical field [0001] The invention relates to the technical field of digital processing, in particular to a dictionary encoding method for test data. Background technique [0002] With the increase of integrated circuit design scale, the amount of test data increases exponentially, which leads to severe problems such as insufficient storage space, limited IO bandwidth and long test time for traditional external automatic test equipment (ATE). Higher and higher. One of the effective ways to solve the above problems when testing data compression, through compression can reduce data transmission time and reduce the requirements for ATE storage capacity. [0003] Test data usually contains a large number of don't care bits (X-bit), these don't care bits can be assigned as 0 or 1 arbitrarily without affecting the fault coverage. Therefore, using an appropriate encoding algorithm combined with a corresponding irrelevant bit filling strategy can achieve data compression and imp...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/3185
CPCG01R31/2851G01R31/318547
Inventor 吴殿丞王东辉洪缨
Owner INST OF ACOUSTICS CHINESE ACAD OF SCI