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Silicon oxide etching method

A technology of silicon dioxide and etching gas, which is applied in the direction of light guide, optics, instrument, etc., can solve the problems of large difference, incomplete removal of bombardment, and increase of polymer, so as to improve performance, reduce etching load effect, Effect of Depth Difference Reduction

Active Publication Date: 2016-07-13
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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Problems solved by technology

During this etching process, C 4 f 8 The polymer generated by the chemical reaction is deposited at the bottom of the narrow groove 1. As the etching depth increases, the bombardment of the Ar plasma cannot completely remove the polymer deposited at the bottom of the narrow groove 1, resulting in an increase in the deposited polymer. Finally, the progress of the etching reaction is hindered, so that the etching of the narrow groove 1 is terminated, and the depth h1 of the narrow groove 1 is too small, so that the difference between the depth h1 of the narrow groove 1 and the depth h2 of the wide groove 2 is large, resulting in the oxidation of The etching loading effect of silicon is obvious, which affects the performance of silicon dioxide optical waveguide devices

Method used

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0021] An embodiment of the present invention provides a method for etching silicon dioxide. The etching method includes applying an etching gas to etch silicon dioxide. The etching gas includes octafluorocyclobutane gas, and the etching gas also includes oxygen. , The polymer generated by octafluorocyclobutane gas during the etching process reacts with oxygen to generate volatile gas.

[0022] The silicon dioxide etching method provided in the embodiment of the pr...

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Abstract

The invention relates to a silicon oxide etching method, and relates to the technical field of etching. The method can alleviate the etching load effect of silicon oxide. According to the embodiment of the invention, the method comprises the steps: carrying out the etching of the silicon oxide through etching gas which comprises octafluorocyclobutane gas and oxygen, wherein polymer generated by the octafluorocyclobutane gas in an etching process reacts with the oxygen to generate volatile gas.

Description

technical field [0001] The invention relates to the technical field of etching, in particular to a silicon dioxide etching method. Background technique [0002] In the field of optics, the optical waveguide technology that fabricates several optical passive devices on the same substrate and interconnects them to form functional circuits through waveguides is a very practical technology. Because silica optical waveguides have good optical, electrical, mechanical properties and thermal stability, and are low in cost, silica optical waveguides are widely used in the field of optical waveguide technology. [0003] figure 1 It is a partial cross-sectional schematic diagram of a silicon dioxide optical waveguide in the prior art, and the silicon dioxide optical waveguide has a narrow groove 1 and a wide groove 2 . Usually dry etching method is used to etch silicon dioxide to form a silicon dioxide optical waveguide with the above structure, for example, octafluorocyclobutane (ch...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B6/136
Inventor 钦华林
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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