Plant leaf spot disease resistance identification new method

An identification method and plant leaf technology are applied in the field of plant leaf spot disease resistance identification, which can solve the problems of low data reliability and leaf occlusion, and achieve the effect of accurate data.

Inactive Publication Date: 2016-07-13
ZHONGKAI UNIV OF AGRI & ENG
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  • Application Information

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Problems solved by technology

[0004] Some scholars proposed to use the number of diseased spots per unit area at the seedling stage. This method can only identify the resistance of plants in a single growth period. Other scholars proposed to quantify the

Method used

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  • Plant leaf spot disease resistance identification new method
  • Plant leaf spot disease resistance identification new method
  • Plant leaf spot disease resistance identification new method

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0032] Example 1: The grading standard of the whole plant disease degree of corn leaf spot disease. See instructions attached image 3 .

[0033] This method is a traditional grading standard for disease severity, with a large range of disease grades, and quantitative traits can only be used as qualitative traits.

Example Embodiment

[0034] Example 2: Rice seedling leaf blast resistance grading standard (IRRI). See instructions attached Figure 4 .

[0035] This is the rice seedling blast resistance classification standard, which is far from the disease classification standard of Example 1. Different crop resistance classification standards are different, and the classification standards are not universal.

Example Embodiment

[0036] Embodiment 3: Embodiment 3 is the present invention.

[0037] 1) Take the leaves to be identified, the leaves are randomly obtained leaves with distinct leaf spots as the samples to be tested.

[0038] 2) Scan the leaf image with a color scanner.

[0039] 3) The measured leaf area pixel value is 1861771, and the lesion area is 200962. See instructions attached Figure 5 , 6 .

[0040] 4) According to the formula, the incidence of a single leaf can be calculated, and the ratio of disease spots to leaf area is 10.7941%. After calculation, it can be seen that the pixel ratio is 165, and the actual leaf area is=1861771 / 165 2 =68.3846(cm 2 ), the actual lesion area = 200962 / 165 2 =7.3815(cm 2 ).

[0041] 5) If you want to calculate the disease degree of the whole plant, it can be calculated according to the formula.

[0042] 6) If you want to estimate the resistance of the entire group, sampling inspection is enough.

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Abstract

The invention discloses a plant leaf spot disease resistance identification new method, which is high in universality, few in subjective conjecture and precise in data. A color scanner is utilized to scan leaves; processing is carried out through image software to obtain precise leaf area and scab area pixel values; and plant leaf spot disease damage condition can be calculated precisely based on the values. The method is high in operability and low in cost, and develops a new level for plant leaf spot disease resistance identification quantization, especially in the application of disease-resistant plant screening, molecular assisted selection and variety plot test disease resistance evaluation in the field of crop disease resistance breeding.

Description

technical field [0001] The invention relates to the field of plant disease resistance genetic breeding, in particular to a new method for identifying plant leaf spot disease resistance. Background technique [0002] Plant disease resistance identification is an important basis for crop disease resistance breeding. The whole process from antigen screening, offspring selection, to variety promotion is inseparable from disease resistance identification. [0003] The current identification method of plant disease resistance is mainly based on the statistics of the disease level. Identification of plant disease resistance through disease-level statistics is highly subjective and cannot objectively express crop disease resistance. At the same time, the classification standards for disease resistance also vary greatly depending on the types of crops and pathogenic bacteria, and are not universally applicable. The classification span of disease resistance is too large and the accu...

Claims

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Application Information

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IPC IPC(8): G06K9/46G06T7/00
Inventor 陈趣蒋锋刘鹏飞张姿丽陈青春张秋荣蒲浩杰
Owner ZHONGKAI UNIV OF AGRI & ENG
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