Method for using a constant temperature total internal reflection microfluidic chip detection all-in-one machine
A technology of microfluidic chip and total internal reflection, which is applied in the direction of scattering characteristic measurement, measuring device, and material analysis through optical means, and can solve the problem of lack of using method of constant temperature all-in-one machine, hindering the development, manufacturing, processing and application of microfluidic technology and other problems, to achieve the effect of uniform and constant temperature, uniform and constant humidity
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[0022] see figure 1 , figure 2 , a constant temperature total internal reflection microfluidic chip detection all-in-one machine, which is composed of a main machine box 1 and a processing display 18, and is characterized in that: the airtight main machine box 1 has an opening on the vertical front side, and the inside of the box body passes The upper and lower box chamber partitions 5 divide the box interior into two layers, the lower floor box room 2 and the upper floor box room 13, and are respectively equipped with independent lower floor transparent doors 17 and upper floor transparent doors 14 at the opening of the box body; the lower floor box room 2 is installed There is an inverted fluorescent microscope 3, and the top of the inverted fluorescent microscope 3 lens is facing the observation window 4; the top of the upper and lower chamber partitions 5 above the observation window 4, that is, on one side of the upper and lower chamber partitions 5 in the upper chamber ...
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