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A split type transmission electron microscope sample holder

A technology of electron microscope and sample rod, which is applied in the direction of circuits, discharge tubes, electrical components, etc., can solve the problems of difficult sample transfer, single function of ordinary sample rods, high transportation costs and high risks, and reduce purchase costs, risks and Cost, the effect of high coaxiality

Active Publication Date: 2017-06-20
咸阳瞪羚谷新材料科技有限公司
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Problems solved by technology

[0005] In order to solve the above-mentioned problems in the prior art, the object of the present invention is to provide a split-type transmission electron microscope sample rod, the functional head of the sample rod can be easily replaced, which solves the single function, transportation costs and risks of ordinary sample rods. Problems with large size and difficult sample transfer

Method used

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  • A split type transmission electron microscope sample holder
  • A split type transmission electron microscope sample holder
  • A split type transmission electron microscope sample holder

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Embodiment Construction

[0023] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0024] like figure 1 and figure 2 As shown, a split-type transmission electron microscope sample rod of the present invention includes a shaft 1 and a functional head 2, a plug 3 is arranged in the center of the housing of the shaft 1, and the plug 3 and the housing of the shaft 1 are filled with A vacuum seal 7, the center of the functional head 2 is provided with a socket 4 that is compatible with the plug 3, and a vacuum seal 7 is also filled between the socket 4 and the housing of the functional head 2, and the plug 3 and the socket 4 are inserted into each other. , to realize the docking of the shaft 1 and the functional head 2, the end of the shell connecting the functional head 2 and the shaft 1 is provided with a connecting head 9, and the outer diameter of the connecting head 9 is smaller than or equal to the shell of the shaft 1 ...

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Abstract

A split-type transmission electron microscope sample rod, including a shaft and a functional head, a plug is arranged at the center of the casing of the shaft, a socket matching the plug is arranged at the center of the functional head, and the socket and the casing of the shaft The space between the plug and the shell of the functional head is filled with vacuum seals, and the plug and the socket are inserted to realize the docking of the shaft and the functional head. The end of the shell where the functional head is connected to the shaft is provided with a connector. The connecting head is inserted into the shaft shell, and a positioning pin is provided at the end of the connecting head, and a positioning groove is provided at a corresponding position in the shell of the shaft. The body and the functional head are provided with external threads on the plug-in end, and a sleeve is placed on the outer sleeve of the functional head, and an internal thread that is compatible with the external threads of the shaft and the functional head is arranged in the sleeve; the functional head of the sample rod of the present invention is detachable. It solves the problems of single function of ordinary sample rod, high transportation cost and risk, and difficult sample transfer.

Description

technical field [0001] The invention belongs to the technical field of in-situ testing of a transmission electron microscope, and in particular relates to a split type transmission electron microscope sample rod. Background technique [0002] The in-situ testing of nanomaterials by transmission electron microscopy is a rapidly developing research direction. The improvement of the sample holder of transmission electron microscopy has always been a hot issue in the field of in-situ testing, and it is also the main driving force for promoting in-situ testing technology. In-situ testing is to observe the physical and chemical changes of materials under specific conditions in real time in the electron microscope. Factors such as the special high vacuum environment, electromagnetic environment and small pole piece size in the transmission electron microscope increase the This makes the design and processing of transmission electron microscope sample rods more difficult, so transmi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J37/20H01J37/26G01N23/04
CPCG01N23/04H01J37/20H01J37/261
Inventor 单智伟张朋诚李蒙张展铭
Owner 咸阳瞪羚谷新材料科技有限公司
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